Presentation 2007-12-14
Relationship Between Errors of Supplementary Information and Misrecognition Rates
Yoshio FURUYA, Masakazu IWAMURA, Koichi KISE, Shinichiro OMACHI, Seiichi UCHIDA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) Pattern recognition with supplementary information is a new pattern recognition framework that determines an output class by combining a classifier's output and supplementary information suggesting the true class. Under the condition that supplementary information does not contain error, we have proposed a theory that reduces misrecognition rates. However, in the real world, we cannot observe any measure without error. Thus, in this paper, we discuss how to reduce misrecognition rates using the erroneous supplementary information, and show the possibility to reduce misrecognition rates experimentally.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) supplementary information / confusion matrix / Bayesian decision boundary / Mahalanobis distace / observation error
Paper # PRMU2007-152
Date of Issue

Conference Information
Committee PRMU
Conference Date 2007/12/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Pattern Recognition and Media Understanding (PRMU)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Relationship Between Errors of Supplementary Information and Misrecognition Rates
Sub Title (in English)
Keyword(1) supplementary information
Keyword(2) confusion matrix
Keyword(3) Bayesian decision boundary
Keyword(4) Mahalanobis distace
Keyword(5) observation error
1st Author's Name Yoshio FURUYA
1st Author's Affiliation Graduate School of Engineering, Osaka Prefecture University()
2nd Author's Name Masakazu IWAMURA
2nd Author's Affiliation Graduate School of Engineering, Osaka Prefecture University
3rd Author's Name Koichi KISE
3rd Author's Affiliation Graduate School of Engineering, Osaka Prefecture University
4th Author's Name Shinichiro OMACHI
4th Author's Affiliation Graduate School of Engineering, Tohoku University
5th Author's Name Seiichi UCHIDA
5th Author's Affiliation Faculty of Information Science and Electrical Engineering, Kyushu University
Date 2007-12-14
Paper # PRMU2007-152
Volume (vol) vol.107
Number (no) 384
Page pp.pp.-
#Pages 6
Date of Issue