| Presentation | 2007-11-22 A New Technique for Elimination of Irregular Data in Measured Values : A Data Screening Technique Appling Skewness of Basic Statistic Shin-ichi OHKAWA, Hiroo MASDA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Consideration of device variation in VLSI design, at present or in future, is very important concerns. Moreover, in each stage of device measurement, variation modeling or reflection on design, there are many steps of developments of technology. And then, many technologies are novel one needing unique basic concept. As one of such many problems, we have developed a new technique which eliminates irregular data in measured values. Skewness of basic statistic is applied to this. Side effects are small for regular data, while it eliminates irregular data efficiently A Reliability of large scale measurements, which is needed for evaluation of devise variation, is remarkably improved. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI / design / variation / measurement / irregular value / screening |
| Paper # | VLD2007-90,DC2007-45 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2007/11/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A New Technique for Elimination of Irregular Data in Measured Values : A Data Screening Technique Appling Skewness of Basic Statistic |
| Sub Title (in English) | |
| Keyword(1) | LSI |
| Keyword(2) | design |
| Keyword(3) | variation |
| Keyword(4) | measurement |
| Keyword(5) | irregular value |
| Keyword(6) | screening |
| 1st Author's Name | Shin-ichi OHKAWA |
| 1st Author's Affiliation | Renesas Technology Corp.() |
| 2nd Author's Name | Hiroo MASDA |
| 2nd Author's Affiliation | Renesas Technology Corp. |
| Date | 2007-11-22 |
| Paper # | VLD2007-90,DC2007-45 |
| Volume (vol) | vol.107 |
| Number (no) | 339 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |