Presentation 2007-11-21
A design method for easily testable multipliers adaptable to various structures of partial product addition
Nobutaka KITO, Naofumi TAKAGI,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We propose a design method for easily testable multipliers. We construct partial product adders of a multiplier with three types of adder blocks. Various combinations of adder blocks lead to various structures of partial product addition for multipliers. A partial product generator and a final adder are also shown. We can construct multipliers with them adaptable to various structures of partial product addition. These multipliers can be tested with 14 test patterns with respect to cell fault model irrespective of its bit width. They require 6 additional input terminals.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) design for testability / C-testability / tree multiplier / array multiplier
Paper # VLD2007-83,DC2007-38
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Conference Date 2007/11/14(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A design method for easily testable multipliers adaptable to various structures of partial product addition
Sub Title (in English)
Keyword(1) design for testability
Keyword(2) C-testability
Keyword(3) tree multiplier
Keyword(4) array multiplier
1st Author's Name Nobutaka KITO
1st Author's Affiliation Graduate School of Information Science, Nagoya University()
2nd Author's Name Naofumi TAKAGI
2nd Author's Affiliation Graduate School of Information Science, Nagoya University
Date 2007-11-21
Paper # VLD2007-83,DC2007-38
Volume (vol) vol.107
Number (no) 338
Page pp.pp.-
#Pages 6
Date of Issue