| Presentation | 2007-11-20 A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing Tomoaki FUKUZAWA, Kohei MIYASE, Yuta YAMATO, Hiroshi FURUKAWA, Xiaoqing WEN, Seiji KAJIHARA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | High power dissipation can occur when a response to the test vector is captured by flip-flops in at-speed scan testing, resulting in excessive IR drop. Excessive IR drop may cause larger gate delays which may cause good chips to fail tests. As a result, significant capture-induced yield loss may occur in the deep submicron era. This paper addresses this serious problem with a new transition delay test generation method, featuring a unique algorithm that deterministically generates test cubes not only for fault detection but also for capture power reduction. In general, the number of test patterns tends to increase in low power testing, but the new method achieves capture power reduction with less test set inflation. Experimental results show its effectiveness. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Low Capture Power / ATPG / X-filling / At-speed scan testing |
| Paper # | VLD2007-71,DC2007-26 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2007/11/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing |
| Sub Title (in English) | |
| Keyword(1) | Low Capture Power |
| Keyword(2) | ATPG |
| Keyword(3) | X-filling |
| Keyword(4) | At-speed scan testing |
| 1st Author's Name | Tomoaki FUKUZAWA |
| 1st Author's Affiliation | Dept of CSE, Kyushu Institute of Technology() |
| 2nd Author's Name | Kohei MIYASE |
| 2nd Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 3rd Author's Name | Yuta YAMATO |
| 3rd Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 4th Author's Name | Hiroshi FURUKAWA |
| 4th Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 5th Author's Name | Xiaoqing WEN |
| 5th Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| 6th Author's Name | Seiji KAJIHARA |
| 6th Author's Affiliation | Dept of CSE, Kyushu Institute of Technology |
| Date | 2007-11-20 |
| Paper # | VLD2007-71,DC2007-26 |
| Volume (vol) | vol.107 |
| Number (no) | 337 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |