| Presentation | 2007-11-20 Stuck-at Test Data Compression using Scan FFs with Delay Fault Testability Kentaroh KATOH, Kazuteru NAMBA, Hideo ITO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a stuck-at test data compression technique using the scan flip flops with delay fault testability. The propose technique consists of two-phase test data compression. First, the proposed technique compresses the test data volume utilizing the unique structure of the scan flip flop (1st compression process). Second, it compresses again the compresseded test data utilizing X data (2nd compression process). Evaluation shows that the proposed technique for huffman test data compression generates smaller compressed test data for ATE than conventional huffman data compression. The amount of compressed test data for ATE by the proposed technique is less 37.1% in maximum, 26.0% on average than the one by the conventional technique. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | FFs with delay fault testability / scan vector length compression / one step scan-in operation / two step scan-in operation |
| Paper # | VLD2007-70,DC2007-25 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2007/11/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Stuck-at Test Data Compression using Scan FFs with Delay Fault Testability |
| Sub Title (in English) | |
| Keyword(1) | FFs with delay fault testability |
| Keyword(2) | scan vector length compression |
| Keyword(3) | one step scan-in operation |
| Keyword(4) | two step scan-in operation |
| 1st Author's Name | Kentaroh KATOH |
| 1st Author's Affiliation | Graduate School of Science and Technology, Chiba University() |
| 2nd Author's Name | Kazuteru NAMBA |
| 2nd Author's Affiliation | Graduate School of Advanced Integration Sciences, Chiba University |
| 3rd Author's Name | Hideo ITO |
| 3rd Author's Affiliation | Graduate School of Advanced Integration Sciences, Chiba University |
| Date | 2007-11-20 |
| Paper # | VLD2007-70,DC2007-25 |
| Volume (vol) | vol.107 |
| Number (no) | 337 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |