Presentation 2007-11-21
Clone Resistance in Artifact-metric Systems : How to Evaluate the Clone Resistance
Yuko TAMURA, Masashi UNE,
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Abstract(in English) Artifact-metrics is a technique to authenticate an artifact by using its physical feature that even the manufacturer can hardly control, and can be used as a counterfeit deterrence in the artifact. Such a security characteristic is called "clone resistance," and has been evaluated in several artifact-metric systems previously proposed. However, previous results of the clone resistance evaluation have open problems. For instance, it is difficult to compare the evaluation results because objectives of the evaluation are different. In this paper, we clarify these problems and show items to be discussed for the development of a useful evaluation method. Concretely, we divide each of five known attacks against an artifact-metric system into four actions and examine the feasibility in each of the actions. Furthermore, we present future research topics to improve an evaluation method for the clone resistance.
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Keyword(in English) artifact-metrics / authentication / clone resistance / counterfeit deterrence / evaluation measure
Paper # ISEC2007-91,OIS2007-63
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Committee ISEC
Conference Date 2007/11/14(1days)
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Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Clone Resistance in Artifact-metric Systems : How to Evaluate the Clone Resistance
Sub Title (in English)
Keyword(1) artifact-metrics
Keyword(2) authentication
Keyword(3) clone resistance
Keyword(4) counterfeit deterrence
Keyword(5) evaluation measure
1st Author's Name Yuko TAMURA
1st Author's Affiliation Center for Information Technology Studies(CITECS), Institute for Monetary and Economic Studies(IMES), Bank of Japan()
2nd Author's Name Masashi UNE
2nd Author's Affiliation Center for Information Technology Studies(CITECS), Institute for Monetary and Economic Studies(IMES), Bank of Japan
Date 2007-11-21
Paper # ISEC2007-91,OIS2007-63
Volume (vol) vol.107
Number (no) 345
Page pp.pp.-
#Pages 8
Date of Issue