Presentation 2007-11-18
Four Valued SRAM with Neuron MOSFETs
Yoshiaki HIRATA, Yoshikazu ISHIMARU, Akio SHIMIZU, Sumio FUKAI,
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Abstract(in English) In this paper, we propose Four Valued SRAM that use a changeable threshold of neuron MOS transistor (νMOSFETs) as a mean to identify multivalued signals. νMOSFETs not only bringing production costs down with standard CMOS process, but also facilitating coexistence with binary logical circuit. Four Valued SRAM is circuit that can preserve signals in two bits per one memory cell by using four signals of 0, 1, 2, and 3. We compare the proposal circuit with the conventional circuit regarding the area of the circuit, operation speed, and power consumption of the SRAM cell. The proposed circuit is designed by using device parameter of standard CMOS 1.2μm process. The performance of Four Valued SRAM cell is evaluated by HSPICE simulation.
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Keyword(in English) neuron MOSFETs / Four Valued SRAM
Paper # NC2007-62
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Committee NC
Conference Date 2007/11/11(1days)
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Registration To Neurocomputing (NC)
Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Four Valued SRAM with Neuron MOSFETs
Sub Title (in English)
Keyword(1) neuron MOSFETs
Keyword(2) Four Valued SRAM
1st Author's Name Yoshiaki HIRATA
1st Author's Affiliation Saga University()
2nd Author's Name Yoshikazu ISHIMARU
2nd Author's Affiliation Saga University
3rd Author's Name Akio SHIMIZU
3rd Author's Affiliation Saga University
4th Author's Name Sumio FUKAI
4th Author's Affiliation Saga University
Date 2007-11-18
Paper # NC2007-62
Volume (vol) vol.107
Number (no) 328
Page pp.pp.-
#Pages 6
Date of Issue