Presentation 2007-10-12
Theoretical study of high-frequency performance for AlInN/InGaN heterojunction FETs
Kazuki KODAMA, Taketoshi NISHIDA, Kenji SHIOJIMA, Masaaki KUZUHARA,
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Abstract(in English) High-frequency performance of AlInN/InGaN heterojunction FETs has been theoretically studied. Analyses were made using 2D ensemble Monte Carlo simulation. Due to the superior electron transport properties of InGaN, high-frequency performance was significantly improved for devices with InGaN or InN as a channel material. Simulation results indicated that the AlInN/InN HEMT devices with a gate length of below 20nm reached a current gain cutoff frequency in a THz frequency range.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InGaN / InN / HEMT / current gain cutoff frequency / THz
Paper # ED2007-171,CPM2007-97,LQE2007-72
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Committee LQE
Conference Date 2007/10/4(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Theoretical study of high-frequency performance for AlInN/InGaN heterojunction FETs
Sub Title (in English)
Keyword(1) InGaN
Keyword(2) InN
Keyword(3) HEMT
Keyword(4) current gain cutoff frequency
Keyword(5) THz
1st Author's Name Kazuki KODAMA
1st Author's Affiliation Department of Electrical and Electronics Engineering, Graduate School of Engineering, University of Fukui()
2nd Author's Name Taketoshi NISHIDA
2nd Author's Affiliation Department of Electrical and Electronics Engineering, Graduate School of Engineering, University of Fukui
3rd Author's Name Kenji SHIOJIMA
3rd Author's Affiliation Department of Electrical and Electronics Engineering, Graduate School of Engineering, University of Fukui
4th Author's Name Masaaki KUZUHARA
4th Author's Affiliation Department of Electrical and Electronics Engineering, Graduate School of Engineering, University of Fukui
Date 2007-10-12
Paper # ED2007-171,CPM2007-97,LQE2007-72
Volume (vol) vol.107
Number (no) 253
Page pp.pp.-
#Pages 4
Date of Issue