| Presentation | 2007-10-11 Suppression of COD in pure-blue laser diodes with current injection-free region near the laser facet Osamu GOTO, Yoshitsugu OHIZUMI, Miwako SHOJI, Takayuki TANAKA, Yukio HOSHINA, Makoto OHTA, Yoshifumi YABUKI, Shigetaka TOMIYA, Masao IKEDA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | High-power and long-lived AlGaInN-based pure-blue laser diodes (LDs) emitting in the 440-450 nm wavelength range were successfully developed. They had estimated lifetimes (the time for the output power to degrade to half its initial value in constant current mode) of more than 10000 hours at a power of 0.75 W under continuous-wave operation at 25℃. This paper presents the suppression of catastrophic optical damage (COD) in pure-blue LDs, which have current injection-free region near the laser facets. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Pure-blue LD / MOCVD / GaN substrate / Current injection-free structure |
| Paper # | ED2007-162,CPM2007-88,LQE2007-63 |
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| Conference Information | |
| Committee | LQE |
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| Conference Date | 2007/10/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Chair | |
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| Paper Information | |
| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Suppression of COD in pure-blue laser diodes with current injection-free region near the laser facet |
| Sub Title (in English) | |
| Keyword(1) | Pure-blue LD |
| Keyword(2) | MOCVD |
| Keyword(3) | GaN substrate |
| Keyword(4) | Current injection-free structure |
| 1st Author's Name | Osamu GOTO |
| 1st Author's Affiliation | Semiconductor Business Group, Sony corporation() |
| 2nd Author's Name | Yoshitsugu OHIZUMI |
| 2nd Author's Affiliation | Sony Shiroishi Semiconductor Inc. |
| 3rd Author's Name | Miwako SHOJI |
| 3rd Author's Affiliation | Sony Shiroishi Semiconductor Inc. |
| 4th Author's Name | Takayuki TANAKA |
| 4th Author's Affiliation | Sony Shiroishi Semiconductor Inc. |
| 5th Author's Name | Yukio HOSHINA |
| 5th Author's Affiliation | Sony Shiroishi Semiconductor Inc. |
| 6th Author's Name | Makoto OHTA |
| 6th Author's Affiliation | Sony Shiroishi Semiconductor Inc. |
| 7th Author's Name | Yoshifumi YABUKI |
| 7th Author's Affiliation | Semiconductor Business Group, Sony corporation |
| 8th Author's Name | Shigetaka TOMIYA |
| 8th Author's Affiliation | Material Research Lab., Sony Corporation |
| 9th Author's Name | Masao IKEDA |
| 9th Author's Affiliation | Material Research Lab., Sony Corporation |
| Date | 2007-10-11 |
| Paper # | ED2007-162,CPM2007-88,LQE2007-63 |
| Volume (vol) | vol.107 |
| Number (no) | 253 |
| Page | pp.pp.- |
| #Pages | 3 |
| Date of Issue | |