Presentation 2007-10-11
Effects of trace moisture in NH_3 gas on electroluminescence intensity of InGaN LED : Moisture control in NH_3 gas for MOVPE growth of LED structure
Hirotaka MANGYOU, Hiroyuki ONO, Yoshihiko KOBAYASHI, Koh MATSUMOTO, Kazunobu SHIBUYA,
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Abstract(in English) We have been developing nitride-semiconductor-related technologies, such as Metal Organic Vapor Phase Epitaxy (MOVPE), NH_3 gas purification and trace moisture analysis techniques in NH_3 gas. The moisture in NH_3 gas is likely to have an influence on the film growth of the GaN by MOVPE. In this research, electroluminescence (EL) intensity of LED was shown to be decreased by the incorporation of moisture in the rector atmosphere into InGaN/GaN quantum well layers. We have also demonstrated that NH_3 gas purifier can effectively eliminate a trace of moisture, so that a high and constant purity NH_3 gas is continuously supplied to the reactor, which is confirmed by on-site measurement of trace moisture by CRDS, and also by ex-situ characterization, by EL and SIMS measurement.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MOCVD / InGaN/GaN multi quantum well structure / purifier / NH_3gas
Paper # ED2007-160,CPM2007-86,LQE2007-61
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Committee LQE
Conference Date 2007/10/4(1days)
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Registration To Lasers and Quantum Electronics (LQE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Effects of trace moisture in NH_3 gas on electroluminescence intensity of InGaN LED : Moisture control in NH_3 gas for MOVPE growth of LED structure
Sub Title (in English)
Keyword(1) MOCVD
Keyword(2) InGaN/GaN multi quantum well structure
Keyword(3) purifier
Keyword(4) NH_3gas
1st Author's Name Hirotaka MANGYOU
1st Author's Affiliation Leading Edge Technology Development Department, Business Strategy Planning Division, Electronics Group, TAIYO NIPPON SANSO Corporation()
2nd Author's Name Hiroyuki ONO
2nd Author's Affiliation Specialty gas analysis division Analysis technology center Tsukuba Laboratories Development & Engineering, TAIYO NIPPON SANSO Corporation
3rd Author's Name Yoshihiko KOBAYASHI
3rd Author's Affiliation Leading Edge Technology Development Department, Business Strategy Planning Division, Electronics Group, TAIYO NIPPON SANSO Corporation
4th Author's Name Koh MATSUMOTO
4th Author's Affiliation Leading Edge Technology Development Department, Business Strategy Planning Division, Electronics Group, TAIYO NIPPON SANSO Corporation
5th Author's Name Kazunobu SHIBUYA
5th Author's Affiliation Leading Edge Technology Development Department, Business Strategy Planning Division, Electronics Group, TAIYO NIPPON SANSO Corporation
Date 2007-10-11
Paper # ED2007-160,CPM2007-86,LQE2007-61
Volume (vol) vol.107
Number (no) 253
Page pp.pp.-
#Pages 4
Date of Issue