| Presentation | 2007-10-16 Evaluation Model of Pseudo Random Pattern Quality for Logic BIST Satoshi FUKUMOTO, Harunobu KUROKAWA, Masayuki ARAI, Kazuhiko IWASAKI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we discuss the stochastic and statistical analyses on the distribution of fault coverage in random-pattern testing. We introduce the stochastic variable which maps the events of detection and non-detection of each fault on a random-pattern testing into the integers 1 and 0 respectively. Based on this stochastic variable, we establish the stochastic evaluation model and investigate the estimation of the distribution of fault coverage. We show that the expected number of detected faults and/or fault coverage can be estimated precisely from the test results for individual test patterns in one test sequence. We propose computational approach for nonparametric estimation of the distribution of fault coverage. Re-sampling from the results for individual test patterns in about 2 to 10 test sequences enables us to effectively generate the histogram for the distribution of fault coverage. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | built-in self test / linear feedback shift register / random pattern testing / fault coverage / re-sampling |
| Paper # | DE2007-124,DC2007-21 |
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| Conference Information | |
| Committee | DE |
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| Conference Date | 2007/10/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Data Engineering (DE) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation Model of Pseudo Random Pattern Quality for Logic BIST |
| Sub Title (in English) | |
| Keyword(1) | built-in self test |
| Keyword(2) | linear feedback shift register |
| Keyword(3) | random pattern testing |
| Keyword(4) | fault coverage |
| Keyword(5) | re-sampling |
| 1st Author's Name | Satoshi FUKUMOTO |
| 1st Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University() |
| 2nd Author's Name | Harunobu KUROKAWA |
| 2nd Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University |
| 3rd Author's Name | Masayuki ARAI |
| 3rd Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University |
| 4th Author's Name | Kazuhiko IWASAKI |
| 4th Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University |
| Date | 2007-10-16 |
| Paper # | DE2007-124,DC2007-21 |
| Volume (vol) | vol.107 |
| Number (no) | 254 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |