Presentation 2007-10-16
Designing Pairwise Testsets that Optimize Executing Cost
Shin KIMOTO, Tatsuhiro TSUCHIYA, Tohru KIKUNO,
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Abstract(in English) Pairwise testing is a software testing strategy that aims to reduce the cost of testing. This strategy requires that all possible pairs of input parameters be covered by at least one testcase. Although existing techniques for pairwise testcase generation aim to reduce the size of generated test suites, they do not explicitly consider the cost of test execution. In practical situations, testcases are sequentially executed. If two consecutive testcases require setting up different system configurations, additional cost may be incurred in changing the configurations. This paper proposes two algorithms to construct pairwise test suites of both small size and low cost.
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Keyword(in English) pairwise testing / software testing / testcase generation / test execution cost
Paper # DE2007-123,DC2007-20
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Committee DE
Conference Date 2007/10/8(1days)
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Paper Information
Registration To Data Engineering (DE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Designing Pairwise Testsets that Optimize Executing Cost
Sub Title (in English)
Keyword(1) pairwise testing
Keyword(2) software testing
Keyword(3) testcase generation
Keyword(4) test execution cost
1st Author's Name Shin KIMOTO
1st Author's Affiliation Graduate School of Information Science and Technology, Osaka University()
2nd Author's Name Tatsuhiro TSUCHIYA
2nd Author's Affiliation Graduate School of Information Science and Technology, Osaka University
3rd Author's Name Tohru KIKUNO
3rd Author's Affiliation Graduate School of Information Science and Technology, Osaka University
Date 2007-10-16
Paper # DE2007-123,DC2007-20
Volume (vol) vol.107
Number (no) 254
Page pp.pp.-
#Pages 4
Date of Issue