Presentation 2007-08-24
Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs
Mitsuya FUKAZAWA, Tetsuro MATSUNO, Toshifumi UEMURA, Rei AKIYAMA, Tetsuya KAGEMOTO, Hiroshi MAKINO, Hidehiro TAKATA, Makoto NAGATA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Fine-grained built-in probing circuits are distributed at 120 locations on the SoC to allow continuous-time monitoring of power-supply variations. On-die high-pricision sampling circuits with 800μV/100ps resolution allow probing of 26 chip-wide locations of the CPU core including SRAM modules. Analog waveforms and peak-voltage measurements show confirmation of dynamic operation-mode transitions.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Built-in proing circuit / Dynamic power supply noise / Power supply integrity / Operation-mode transition / Dynamic frequency scaling
Paper # SDM2007-156,ICD2007-84
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Conference Date 2007/8/16(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variation in SoCs
Sub Title (in English)
Keyword(1) Built-in proing circuit
Keyword(2) Dynamic power supply noise
Keyword(3) Power supply integrity
Keyword(4) Operation-mode transition
Keyword(5) Dynamic frequency scaling
1st Author's Name Mitsuya FUKAZAWA
1st Author's Affiliation Department of Computer Science and Systems Engineering, Graduate School of Engineering, Kobe University()
2nd Author's Name Tetsuro MATSUNO
2nd Author's Affiliation Department of Computer Science and Systems Engineering, Graduate School of Engineering, Kobe University
3rd Author's Name Toshifumi UEMURA
3rd Author's Affiliation Department of Computer Science and Systems Engineering, Graduate School of Engineering, Kobe University
4th Author's Name Rei AKIYAMA
4th Author's Affiliation Renesas Design Corporation
5th Author's Name Tetsuya KAGEMOTO
5th Author's Affiliation Renesas Technology Corporation
6th Author's Name Hiroshi MAKINO
6th Author's Affiliation Renesas Technology Corporation
7th Author's Name Hidehiro TAKATA
7th Author's Affiliation Renesas Technology Corporation
8th Author's Name Makoto NAGATA
8th Author's Affiliation Department of Computer Science and Systems Engineering, Graduate School of Engineering, Kobe University
Date 2007-08-24
Paper # SDM2007-156,ICD2007-84
Volume (vol) vol.107
Number (no) 195
Page pp.pp.-
#Pages 6
Date of Issue