Presentation 2007-08-23
Power Measurement for a Multiplier with Run Time Power Gating
Toshihiro KASHIMA, Seidai TAKEDA, Toshiaki SHIRAI, Naoaki OHKUBO, Kimiyoshi USAMI,
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Abstract(in English) This paper describes a result of measurement of a Multiplier with Run Time Power Gating (RTPG). This multiplier has a scheme to dynamically reduce the leakage power according to a bit size of multiplied values. If one or both multiplied values have less than 16bit value, power gating is dynamically applied to the part of logic gates that need not to calculate output values. We design and implement this multiplier using ASPLA 90nm technology and measurement the leakage power. Experimental results show that this scheme enables to reduce the leakage power of multiplier up to 24% in the active mode, 58% in standby mode respectively at 25℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MTCMOS curcuits / Dynamic Sleep Control / Leakage Power / Multiplier / Power Dissipation
Paper # SDM2007-152,ICD2007-80
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Conference Date 2007/8/16(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Power Measurement for a Multiplier with Run Time Power Gating
Sub Title (in English)
Keyword(1) MTCMOS curcuits
Keyword(2) Dynamic Sleep Control
Keyword(3) Leakage Power
Keyword(4) Multiplier
Keyword(5) Power Dissipation
1st Author's Name Toshihiro KASHIMA
1st Author's Affiliation Graduate School of Engineering, Shibaura Institute of Technology()
2nd Author's Name Seidai TAKEDA
2nd Author's Affiliation Graduate School of Engineering, Shibaura Institute of Technology
3rd Author's Name Toshiaki SHIRAI
3rd Author's Affiliation Department of Information Science and Engineering, Shibaura Institute of Technology
4th Author's Name Naoaki OHKUBO
4th Author's Affiliation Graduate School of Engineering, Shibaura Institute of Technology
5th Author's Name Kimiyoshi USAMI
5th Author's Affiliation Department of Information Science and Engineering, Shibaura Institute of Technology
Date 2007-08-23
Paper # SDM2007-152,ICD2007-80
Volume (vol) vol.107
Number (no) 195
Page pp.pp.-
#Pages 6
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