Presentation 1999/9/17
ALLOCATION OF SAFETY INTEGRITY LEVELS : Functional Safety of E/E/PE Safety-Related Systems
Eiichi Kato, Yoshinobu Sato,
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Abstract(in English) One of the fundamental concepts of the standard, IEC 6150, is the target failure measures to be allocated to Electric/Electronic/Programmable Electronic Safety-Related Systems (SRSs), i.e., Safety Integrity Levels (SILs). In order to choose between the SILs, the standard classifies SRSs into two modes of operation. It was unclear which modes of operation should be applied to SRSs in the draft standard. The authors addressed this issue by proposing a new fault-tree model, deriving algorithm to quantify the model and to estimate the frequencies of harmful events. After that, the definitions for modes of operation were changed in the published standard. The present paper examines those new definitions in the view of estimation of harmful event frequencies.
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Keyword(in English) safety integrity level / modes of operation / frequency of harmful event / safety-related system / programmable electronic / functional safety
Paper # R99-11
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Conference Date 1999/9/17(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) ALLOCATION OF SAFETY INTEGRITY LEVELS : Functional Safety of E/E/PE Safety-Related Systems
Sub Title (in English)
Keyword(1) safety integrity level
Keyword(2) modes of operation
Keyword(3) frequency of harmful event
Keyword(4) safety-related system
Keyword(5) programmable electronic
Keyword(6) functional safety
1st Author's Name Eiichi Kato
1st Author's Affiliation Fuji Planning Corporation()
2nd Author's Name Yoshinobu Sato
2nd Author's Affiliation Tokyo University of Mercantile Marine
Date 1999/9/17
Paper # R99-11
Volume (vol) vol.99
Number (no) 307
Page pp.pp.-
#Pages 4
Date of Issue