Presentation 2007/6/18
Effect of Bias Sweep on Pentacene Thin Film Transistor
Chang-Woo Sohn, Keun-Kyu Song, Bo-Sung Kim, Seong-Sik Shin, Sung-Woo Jung, Yoon-Ha Jeong,
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Abstract(in English) In this paper, we report dynamic effects of bias sweep on pentacene thin film transistors during the measurement of current-voltage characteristics. A device was measured using two different methods; namely, the gate-sweep method and the drain-sweep method. These methods were compared each other under various bias sweep conditions such as different sweep, direction and different sweep steps. The experimental results show that drain current can. be underestimated while the gate bias keeps under on-state. Also, the drain current can be overestimated while the gate bias changes from off-state to on-state. We interpret these phenomena as time dependent behavior of charge trapping. For accurate modeling of the device, the dynamic effects of charge trapping should be considered.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Pentacene thin film transistor / Bias sweep / Charge trapping
Paper # ED2007-129,SDM2007-134
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Committee ED
Conference Date 2007/6/18(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Effect of Bias Sweep on Pentacene Thin Film Transistor
Sub Title (in English)
Keyword(1) Pentacene thin film transistor
Keyword(2) Bias sweep
Keyword(3) Charge trapping
1st Author's Name Chang-Woo Sohn
1st Author's Affiliation Dept. of Electronic and Electrical Engineering, Pohang University of Science and Technology()
2nd Author's Name Keun-Kyu Song
2nd Author's Affiliation LCD R&D Center LCD Business, Samsung Electronics Co., Ltd.
3rd Author's Name Bo-Sung Kim
3rd Author's Affiliation LCD R&D Center LCD Business, Samsung Electronics Co., Ltd.
4th Author's Name Seong-Sik Shin
4th Author's Affiliation LCD R&D Center LCD Business, Samsung Electronics Co., Ltd.
5th Author's Name Sung-Woo Jung
5th Author's Affiliation National Center for Nanomaterials Technology (NCNT)
6th Author's Name Yoon-Ha Jeong
6th Author's Affiliation Dept. of Electronic and Electrical Engineering, Pohang University of Science and Technology:National Center for Nanomaterials Technology (NCNT)
Date 2007/6/18
Paper # ED2007-129,SDM2007-134
Volume (vol) vol.107
Number (no) 110
Page pp.pp.-
#Pages 4
Date of Issue