Presentation 2007/6/18
Low Gate Leakage Current HEMTs by a New Airbridge Gate and a Liquid Oxidization Surface
Feng-Tso Chien, Chien-Liang Chan, Chin-Mu Fang, Chien-Nan Liao, Yao-Tsung Tsai,
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Abstract(in English) Conventional AlGaAs/InGaAs high electron mobility transistors (HEMTs) have high gate leakage current due to gate electrode contact to the exposed channel layer and the carrier provided layer on mesa sidewall. In this study, we used a new no step airbridge gate structure to reduce the gate leakage and improve the breakdown voltage. Furthermore, a liquid oxidization method is applied to further reduce the gate leakage. Those proposed methods didn't increase any masks as compared with the conventional process. In our study, the new airbridge gate structure shows smaller gate-source capacitance than the conventional structure. Therefore, the device high frequency performances can be improved. We will demonstrate the enhanced device characteristics of gate-to-drain breakdown voltages, RF and microwave power performances by using airbridge gate structure and conventional HEMTs.
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Keyword(in English) Gate leakage / High electron mobility transistor / airbridge
Paper # ED2007-117,SDM2007-122
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Committee ED
Conference Date 2007/6/18(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Low Gate Leakage Current HEMTs by a New Airbridge Gate and a Liquid Oxidization Surface
Sub Title (in English)
Keyword(1) Gate leakage
Keyword(2) High electron mobility transistor
Keyword(3) airbridge
1st Author's Name Feng-Tso Chien
1st Author's Affiliation Dept. of Electronic Engineering, Feng-Chia University()
2nd Author's Name Chien-Liang Chan
2nd Author's Affiliation Dept. of Electronic Engineering, Feng-Chia University
3rd Author's Name Chin-Mu Fang
3rd Author's Affiliation Dept. of Electronic Engineering, Feng-Chia University
4th Author's Name Chien-Nan Liao
4th Author's Affiliation Dept. of Electrical Engineering, National Central University
5th Author's Name Yao-Tsung Tsai
5th Author's Affiliation Dept. of Electrical Engineering, National Central University
Date 2007/6/18
Paper # ED2007-117,SDM2007-122
Volume (vol) vol.107
Number (no) 110
Page pp.pp.-
#Pages 4
Date of Issue