Presentation 2007/6/18
Room-temperature-operating single-electron devices using silicon nanowire MOSFET
Katsuhiko NISHIGUCHI, Yukinori ONO, Akira FUJIWARA, Hiroshi INOKAWA, Yasuo TAKAHASHI,
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Abstract(in English) In this paper, we report the development of devices for single-electron transfer and detection at room temperature, using silicon (Si) metal-oxide-semiconductor field-effect transistors (MOSFETs). Single electrons are transferred to a storage node (SN) by modulating the potential barrier in the channel of the MOSFETs. Another MOSFET, located close to the SN, detects electrons transferred into the SN with single-electron resolution. These transfer and detection functions were applied to a digital-to-analog converter, gain-cell memory, and infrared sensor.
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Keyword(in English) Single electron / transfer / detection / MOSFET
Paper # ED2007-82,SDM2007-87
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Committee ED
Conference Date 2007/6/18(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Room-temperature-operating single-electron devices using silicon nanowire MOSFET
Sub Title (in English)
Keyword(1) Single electron
Keyword(2) transfer
Keyword(3) detection
Keyword(4) MOSFET
1st Author's Name Katsuhiko NISHIGUCHI
1st Author's Affiliation NTT Basic Research Labs., NTT Corporation()
2nd Author's Name Yukinori ONO
2nd Author's Affiliation NTT Basic Research Labs., NTT Corporation
3rd Author's Name Akira FUJIWARA
3rd Author's Affiliation NTT Basic Research Labs., NTT Corporation
4th Author's Name Hiroshi INOKAWA
4th Author's Affiliation Research Institute of Electronics, Shizuoka University
5th Author's Name Yasuo TAKAHASHI
5th Author's Affiliation Graduate School of Information Science and Technology, Hokkaido University
Date 2007/6/18
Paper # ED2007-82,SDM2007-87
Volume (vol) vol.107
Number (no) 110
Page pp.pp.-
#Pages 4
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