| Presentation | 2007/6/18 A Study on MgO-Ta_2O_5 System Ceramics for Microwave Component Application Jae-Sik Jae-Sik, Young-Hie Lee, Eui-Sun Choi, Ki-Won Ryu, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this study, the microwave dielectric properties of the Mg_4Ta_2O_9 and Mg_5Ta_4O_<15> ceramics with composition ratio and sintering temperature were investigated and the dielectric resonators with these ceramics were simulated. TiO_2 was doped in Mg_4Ta_2O_9 ceramics for improvement of temperature property. All specimens of the (1-x)Mg_4Ta_2O_9-xTiO_2 and Mg_5Ta_4O_<15> ceramics were prepared by solid-state reaction method and sintered. According to the X-ray diffraction data, the (1-x)Mg_4Ta_2O_9-xTiO_2 ceramics had main phase of the Mg_4Ta_2O_9 and the MgTi_2O_5 peaks were appeared by the addition of TiO_2. In the Mg_5Ta_4O_<15> ceramics, the Mg_4Ta_2O_9 and MgTa_2O_6 phase coexisted and Mg_5Ta_4O_<15> phase was appeared with increasing the sintering temperature. Microwave dielectric properties of the (1-x)Mg_4Ta_2O_<9-x>TiO_2 ceramics were affected by MgTi_2O_5 and TiO_2 phase. The quality factor had a little decrement compared to pure Mg_4Ta_2O_9, but there was excellent improvement in temperature coefficient of resonant frequency (TCRF) by addition of TiO_2. Densification of the Mg_4Ta_2O_9 and MgTa_2O_6 and existence of the Mg_5Ta_4O_<15> phase had influence on the microwave dielectric properties of the Mg_5Ta_4O_<15> ceramics. The dielectric constant, quality factor and TCRF of the (1-x)Mg_4Ta_2O_9-xTiO_2 and Mg_5Ta_4O_<15> ceramics sintered at 1450℃ were 11.56～22.5, 24,980～186,410 GHz, -36.02～+19.72 ppm/℃ and 8.2, 89,473 GHz, -10.91 ppm/℃, respectively. Advanced Design System (ADS) was used for simulation of DR. The simulated DR with the 0.5Mg_4Ta_2O_9-0.5TiO_2 and Mg_5Ta_4O_<15> ceramics had the operating frequency and S_<21> of 11.97 GHz, -35.034 dB and of 10.50 GHz, -28.493 dB, respectively. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | High quality factor / MgO-Ta_2O_5 / AB_<0.8>O_3 formula / Dielectric resonator |
| Paper # | ED2007-70,SDM2007-75 |
| Date of Issue |
| Conference Information | |
| Committee | ED |
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| Conference Date | 2007/6/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
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| Paper Information | |
| Registration To | Electron Devices (ED) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study on MgO-Ta_2O_5 System Ceramics for Microwave Component Application |
| Sub Title (in English) | |
| Keyword(1) | High quality factor |
| Keyword(2) | MgO-Ta_2O_5 |
| Keyword(3) | AB_<0.8>O_3 formula |
| Keyword(4) | Dielectric resonator |
| 1st Author's Name | Jae-Sik Jae-Sik |
| 1st Author's Affiliation | Electronic Materials Engineering, Kwangwoon University() |
| 2nd Author's Name | Young-Hie Lee |
| 2nd Author's Affiliation | Electronic Materials Engineering, Kwangwoon University |
| 3rd Author's Name | Eui-Sun Choi |
| 3rd Author's Affiliation | Electronic Materials Engineering, Kwangwoon University |
| 4th Author's Name | Ki-Won Ryu |
| 4th Author's Affiliation | Electronic Engineering, Yeojoo College |
| Date | 2007/6/18 |
| Paper # | ED2007-70,SDM2007-75 |
| Volume (vol) | vol.107 |
| Number (no) | 110 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |