Presentation | 2007/6/18 Quantum-Mechanical Effects in Nanometer Scale MuGFETs Se Re Na Yun, Chong Gun Yu, Jong Tae Park, Jean Pierre Colinge, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Solving the Poisson and Schrodinger equations self-consistently in two-dimensions reveals quantum-mechanical effects that influence the electron concentration, the threshold voltage and the drain current in MuGFETs. The average electron concentration needed to reach the threshold voltage depends on the gate configurations and the device geometry. The dependence of the energy of the lowest subband on the different gate configurations is studied, and the relation between threshold voltage and the lowest subband energy is investigated. The reduced drain current due to the dynamic threshold voltage effect has been analyzed. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | SOI technology / MuGFET / quantum-mechanical effects / energy subbands / silicon nanowires |
Paper # | ED2007-54,SDM2007-59 |
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Committee | ED |
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Conference Date | 2007/6/18(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Quantum-Mechanical Effects in Nanometer Scale MuGFETs |
Sub Title (in English) | |
Keyword(1) | SOI technology |
Keyword(2) | MuGFET |
Keyword(3) | quantum-mechanical effects |
Keyword(4) | energy subbands |
Keyword(5) | silicon nanowires |
1st Author's Name | Se Re Na Yun |
1st Author's Affiliation | Dept. of Electronics Engineering, University of Incheon() |
2nd Author's Name | Chong Gun Yu |
2nd Author's Affiliation | Dept. of Electronics Engineering, University of Incheon |
3rd Author's Name | Jong Tae Park |
3rd Author's Affiliation | Dept. of Electronics Engineering, University of Incheon |
4th Author's Name | Jean Pierre Colinge |
4th Author's Affiliation | Dept. of Electrical and Computer Engineering, University of California |
Date | 2007/6/18 |
Paper # | ED2007-54,SDM2007-59 |
Volume (vol) | vol.107 |
Number (no) | 110 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |