Presentation 2007/5/17
Growth of high quality ZnO film and application for UV detector
Takao HAYASHI, Atsushi NAKAMURA, Jiro TEMMYO, Nabarro Tober Alvaro, Munoz Merino Elias,
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Abstract(in English) ZnO thin films were grown by remote plasma enhanced MOCVD. Diethyl zinc (DEZn) were used as group-II source. Oxygen gas were used as group-VI source, and VI/II ratio was controlled by varying flowing quantity of oxygen gas. The surface morphology of ZnO thin film is shape like the rod when VI/II ratio is small. It has changed into a smooth surface by increasing VI/II ratio. And the carrier concentration of ZnO thin film has been decreased from 5E+18 cm^<-3> to 5E+17 cm^<-3> by changing VI/II ratio. Mg_xZn_<1-x>O UV detectors were fabricated and evaluated. An excellent cutoff characteristic was obtained form Mg_xZn_<1-x>O UV detectors, and wavelength has changed from 370 nm to 350 nm.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) high quality ZnO film / UV detector / VI/II ratio / surface morphology / carrier concentration
Paper # ED2007-12,CPM2007-11,SDM2007-12
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Conference Information
Committee CPM
Conference Date 2007/5/17(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Growth of high quality ZnO film and application for UV detector
Sub Title (in English)
Keyword(1) high quality ZnO film
Keyword(2) UV detector
Keyword(3) VI/II ratio
Keyword(4) surface morphology
Keyword(5) carrier concentration
1st Author's Name Takao HAYASHI
1st Author's Affiliation Reseach Institute of Electronics, Shizuoka University()
2nd Author's Name Atsushi NAKAMURA
2nd Author's Affiliation Reseach Institute of Electronics, Shizuoka University
3rd Author's Name Jiro TEMMYO
3rd Author's Affiliation Reseach Institute of Electronics, Shizuoka University
4th Author's Name Nabarro Tober Alvaro
4th Author's Affiliation ISOM, Universidad Politecnica de Madrid
5th Author's Name Munoz Merino Elias
5th Author's Affiliation ISOM, Universidad Politecnica de Madrid
Date 2007/5/17
Paper # ED2007-12,CPM2007-11,SDM2007-12
Volume (vol) vol.107
Number (no) 55
Page pp.pp.-
#Pages 5
Date of Issue