| Presentation | 2007-04-20 Degradation Analysis of GaInAsP/InP Laser Diode Hiroyuki ICHIKAWA, Masashi ITO, Chie FUKUDA, Kotaro HAMADA, Akira YAMAGUCHI, Takashi NAKABAYASHI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | BSD-induced degradation is one of the serious reliability problems of GaInAsP/InP LD. We have conducted an analysis on BSD-induced degradation, and clarified the principal mechanisms of degradations under the forward- and reverse-biased voltage conditions. In the case of forward-biased BSD, heating by light absorption at the active layer at a facet is the main cause of degradation. The mechanism of degradation induced by reverse-biased BSD is different. We found out that degradation is caused by the concentration of high electric field on a MQW. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | GaInAsP / InP / ESD |
| Paper # | R2007-6,CPM2007-6,OPE2007-6 |
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| Conference Information | |
| Committee | CPM |
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| Conference Date | 2007/4/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Paper Information | |
| Registration To | Component Parts and Materials (CPM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation Analysis of GaInAsP/InP Laser Diode |
| Sub Title (in English) | |
| Keyword(1) | GaInAsP |
| Keyword(2) | InP |
| Keyword(3) | ESD |
| 1st Author's Name | Hiroyuki ICHIKAWA |
| 1st Author's Affiliation | Transmission Devices R&D Laboratories, Analysis Technology Research Center, Sumitomo Electric Industries, LTD.() |
| 2nd Author's Name | Masashi ITO |
| 2nd Author's Affiliation | Optical Transmission Components Division, Sumitomo Electric Industries, LTD. |
| 3rd Author's Name | Chie FUKUDA |
| 3rd Author's Affiliation | Transmission Devices R&D Laboratories, Sumitomo Electric Industries, LTD. |
| 4th Author's Name | Kotaro HAMADA |
| 4th Author's Affiliation | Analysis Technology Research Center, Transmission Devices R&D Laboratories, Sumitomo Electric Industries, LTD. |
| 5th Author's Name | Akira YAMAGUCHI |
| 5th Author's Affiliation | Semiconductor Devices R&D Laboratories, Sumitomo Electric Industries, LTD. |
| 6th Author's Name | Takashi NAKABAYASHI |
| 6th Author's Affiliation | Optical Transmission Components Division, Sumitomo Electric Industries, LTD. |
| Date | 2007-04-20 |
| Paper # | R2007-6,CPM2007-6,OPE2007-6 |
| Volume (vol) | vol.107 |
| Number (no) | 8 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |