Presentation | 2007-03-09 Statictical Delay Computation of Path-Based Timing Analysis Considering Inter and Intra-Chip Variations Katsumi HOMMA, Izumi NITTA, Toshiyuki SHIBUYA, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Statistical Timing Analysis(SSTA) is a method that calculates circuit delay statistically with process variations. In SSTA, the delay variations are divided into intra-die and inter die variations. Intra-die variations are independent for each cells and lines in a chip. Inter-chip variations area governed by one variation on a chip. In this paper, we propose a new method of computing whole chip delay distribution considering inter and intra-chip variations in path-based SSTA. In practical LSI data experiments, it is confirmed that the propose method is more accurate than previous methods. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Statistical Static Timing Analysis / Intra-die variations / Inter-die variations / Path-based Analysis |
Paper # | VLD2006-156,ICD2006-247 |
Date of Issue |
Conference Information | |
Committee | ICD |
---|---|
Conference Date | 2007/3/2(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Statictical Delay Computation of Path-Based Timing Analysis Considering Inter and Intra-Chip Variations |
Sub Title (in English) | |
Keyword(1) | Statistical Static Timing Analysis |
Keyword(2) | Intra-die variations |
Keyword(3) | Inter-die variations |
Keyword(4) | Path-based Analysis |
1st Author's Name | Katsumi HOMMA |
1st Author's Affiliation | FUJITSU LABORATORIES LTD.() |
2nd Author's Name | Izumi NITTA |
2nd Author's Affiliation | FUJITSU LABORATORIES LTD. |
3rd Author's Name | Toshiyuki SHIBUYA |
3rd Author's Affiliation | FUJITSU LABORATORIES LTD. |
Date | 2007-03-09 |
Paper # | VLD2006-156,ICD2006-247 |
Volume (vol) | vol.106 |
Number (no) | 552 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |