| Presentation | 2007-03-09 Statictical Delay Computation of Path-Based Timing Analysis Considering Inter and Intra-Chip Variations Katsumi HOMMA, Izumi NITTA, Toshiyuki SHIBUYA, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Statistical Timing Analysis(SSTA) is a method that calculates circuit delay statistically with process variations. In SSTA, the delay variations are divided into intra-die and inter die variations. Intra-die variations are independent for each cells and lines in a chip. Inter-chip variations area governed by one variation on a chip. In this paper, we propose a new method of computing whole chip delay distribution considering inter and intra-chip variations in path-based SSTA. In practical LSI data experiments, it is confirmed that the propose method is more accurate than previous methods. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Statistical Static Timing Analysis / Intra-die variations / Inter-die variations / Path-based Analysis |
| Paper # | VLD2006-156,ICD2006-247 |
| Date of Issue |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2007/3/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Statictical Delay Computation of Path-Based Timing Analysis Considering Inter and Intra-Chip Variations |
| Sub Title (in English) | |
| Keyword(1) | Statistical Static Timing Analysis |
| Keyword(2) | Intra-die variations |
| Keyword(3) | Inter-die variations |
| Keyword(4) | Path-based Analysis |
| 1st Author's Name | Katsumi HOMMA |
| 1st Author's Affiliation | FUJITSU LABORATORIES LTD.() |
| 2nd Author's Name | Izumi NITTA |
| 2nd Author's Affiliation | FUJITSU LABORATORIES LTD. |
| 3rd Author's Name | Toshiyuki SHIBUYA |
| 3rd Author's Affiliation | FUJITSU LABORATORIES LTD. |
| Date | 2007-03-09 |
| Paper # | VLD2006-156,ICD2006-247 |
| Volume (vol) | vol.106 |
| Number (no) | 552 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |