| Presentation | 2007/3/2 Easily Testable Multiplier with 4-2 Adder Tree Nobutaka KITO, Kensuke HANAI, Naofumi TAKAGI, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The growth of the scale of VLSI designs makes test cost of VLSI chips expensive. Techniques of test cost reduction are required. A multiplier with a 4-2 adder tree, which is fast and has simple VLSI layout, is useful for a high-speed datapath. We present an easily testable multiplier with a 4-2 adder tree, with respect to the Cell Fault Model (CFM). We treat full adders as cells. We demonstrate a 4-2 adder tree, which has recursive configuration by unificating connection manner between 4-2 adders, has a test set which is derived recursively and whose size is independent of depth of the tree. Also, we demonstrate a design method of a partial product generation circuit to test a 4-2 adder tree through it. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test generation / multiplier / C-testability / 4-2 adder tree |
| Paper # | VLD2006-104,ICD2006-231 |
| Date of Issue |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2007/3/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Easily Testable Multiplier with 4-2 Adder Tree |
| Sub Title (in English) | |
| Keyword(1) | test generation |
| Keyword(2) | multiplier |
| Keyword(3) | C-testability |
| Keyword(4) | 4-2 adder tree |
| 1st Author's Name | Nobutaka KITO |
| 1st Author's Affiliation | Graduate School of Information Science, Nagoya University() |
| 2nd Author's Name | Kensuke HANAI |
| 2nd Author's Affiliation | Graduate School of Information Science, Nagoya University |
| 3rd Author's Name | Naofumi TAKAGI |
| 3rd Author's Affiliation | Graduate School of Information Science, Nagoya University |
| Date | 2007/3/2 |
| Paper # | VLD2006-104,ICD2006-231 |
| Volume (vol) | vol.106 |
| Number (no) | 552 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |