Presentation | 2007/3/2 Easily Testable Multiplier with 4-2 Adder Tree Nobutaka KITO, Kensuke HANAI, Naofumi TAKAGI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The growth of the scale of VLSI designs makes test cost of VLSI chips expensive. Techniques of test cost reduction are required. A multiplier with a 4-2 adder tree, which is fast and has simple VLSI layout, is useful for a high-speed datapath. We present an easily testable multiplier with a 4-2 adder tree, with respect to the Cell Fault Model (CFM). We treat full adders as cells. We demonstrate a 4-2 adder tree, which has recursive configuration by unificating connection manner between 4-2 adders, has a test set which is derived recursively and whose size is independent of depth of the tree. Also, we demonstrate a design method of a partial product generation circuit to test a 4-2 adder tree through it. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | test generation / multiplier / C-testability / 4-2 adder tree |
Paper # | VLD2006-104,ICD2006-231 |
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Conference Information | |
Committee | ICD |
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Conference Date | 2007/3/2(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Easily Testable Multiplier with 4-2 Adder Tree |
Sub Title (in English) | |
Keyword(1) | test generation |
Keyword(2) | multiplier |
Keyword(3) | C-testability |
Keyword(4) | 4-2 adder tree |
1st Author's Name | Nobutaka KITO |
1st Author's Affiliation | Graduate School of Information Science, Nagoya University() |
2nd Author's Name | Kensuke HANAI |
2nd Author's Affiliation | Graduate School of Information Science, Nagoya University |
3rd Author's Name | Naofumi TAKAGI |
3rd Author's Affiliation | Graduate School of Information Science, Nagoya University |
Date | 2007/3/2 |
Paper # | VLD2006-104,ICD2006-231 |
Volume (vol) | vol.106 |
Number (no) | 552 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |