Presentation | 2007-02-02 Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate Zainal BURHANUDIN, Ratno NURYADI, Michiharu TARE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We demonstrate the single-charge sensitivity of single-hole-tunneling (SHT) transistors fabricated on Si-on-insulator (SOI) wafer with p/p^+-Si substrate. As a function of time, the current of the SHT transistor is modulated (1) in dark condition by the successive emission of holes from acceptor levels in the p-Si layer and (2) under light illumination by the storage of photo-excited electrons at the p-Si/SiO_2 interface. In dark condition, the SHT current showed step-like features that could be due to the ionization of single-acceptors. At an appropriate photon incident rate, we believe that the detection of photo-excited single-electron in the substrate could also be realized. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Single-hole-tunneling transistor / single-photon detector / single-acceptor ion. |
Paper # | ED2006-256,SDM2006-244 |
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Conference Information | |
Committee | ED |
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Conference Date | 2007/1/25(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate |
Sub Title (in English) | |
Keyword(1) | Single-hole-tunneling transistor |
Keyword(2) | single-photon detector |
Keyword(3) | single-acceptor ion. |
1st Author's Name | Zainal BURHANUDIN |
1st Author's Affiliation | Research Institue of Electronics, Shizuoka University() |
2nd Author's Name | Ratno NURYADI |
2nd Author's Affiliation | Research Institue of Electronics, Shizuoka University |
3rd Author's Name | Michiharu TARE |
3rd Author's Affiliation | Research Institue of Electronics, Shizuoka University |
Date | 2007-02-02 |
Paper # | ED2006-256,SDM2006-244 |
Volume (vol) | vol.106 |
Number (no) | 520 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |