Presentation 2007-02-02
Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate
Zainal BURHANUDIN, Ratno NURYADI, Michiharu TARE,
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Abstract(in English) We demonstrate the single-charge sensitivity of single-hole-tunneling (SHT) transistors fabricated on Si-on-insulator (SOI) wafer with p/p^+-Si substrate. As a function of time, the current of the SHT transistor is modulated (1) in dark condition by the successive emission of holes from acceptor levels in the p-Si layer and (2) under light illumination by the storage of photo-excited electrons at the p-Si/SiO_2 interface. In dark condition, the SHT current showed step-like features that could be due to the ionization of single-acceptors. At an appropriate photon incident rate, we believe that the detection of photo-excited single-electron in the substrate could also be realized.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Single-hole-tunneling transistor / single-photon detector / single-acceptor ion.
Paper # ED2006-256,SDM2006-244
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Committee ED
Conference Date 2007/1/25(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate
Sub Title (in English)
Keyword(1) Single-hole-tunneling transistor
Keyword(2) single-photon detector
Keyword(3) single-acceptor ion.
1st Author's Name Zainal BURHANUDIN
1st Author's Affiliation Research Institue of Electronics, Shizuoka University()
2nd Author's Name Ratno NURYADI
2nd Author's Affiliation Research Institue of Electronics, Shizuoka University
3rd Author's Name Michiharu TARE
3rd Author's Affiliation Research Institue of Electronics, Shizuoka University
Date 2007-02-02
Paper # ED2006-256,SDM2006-244
Volume (vol) vol.106
Number (no) 520
Page pp.pp.-
#Pages 6
Date of Issue