Presentation 2007-02-01
SiGe Quantum Effect Devices : Resonant Tunneling Diode and Ge Dot Array Technologies
Yoshiyuki SUDA, Hirotaka Maekawa, Yoshihiro SANO, Yoichi TAKAHASHI, Tadamasa KOBAYASHI, Hiroaki HANABUSA,
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Abstract(in English) We are developing SiGe resonant tunneling diodes and an artificially positioned Ge dot array for light communication systems as next-generation nano devices using a Si-system material which is promising in terms of earth resources. Through this work, we have developed a S_<1-x>Ge_x sputter epitaxy method in terms of environmental load issues. We also have proposed a strain-relieving quadruple-layer buffer with which misfit dislocations are evenly distributed in the lower two interfaces and the upper two layers prevent threading dislocations from being propagated to the buffer surface. With this buffer, we have developed electron-tunneling vertical- and planer-type double-quantum-well RTDs. And the negative resistance characteristics of double-quantum-well hole-tunneling RTDs have been first observed at room temperature. Further, we have cleared the Ge dot artificially positioning mechanisms and method and have successfully fabricated artificially dot-positioned stacked Ge dot array.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Quantum Effect Device / Resonant Tunneling Diode / Strain-Relief / Ge Dot / Nano Device
Paper # ED2006-243,SDM2006-231
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Conference Information
Committee ED
Conference Date 2007/1/25(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) SiGe Quantum Effect Devices : Resonant Tunneling Diode and Ge Dot Array Technologies
Sub Title (in English)
Keyword(1) Quantum Effect Device
Keyword(2) Resonant Tunneling Diode
Keyword(3) Strain-Relief
Keyword(4) Ge Dot
Keyword(5) Nano Device
1st Author's Name Yoshiyuki SUDA
1st Author's Affiliation Graduate School of Engineering, Tokyo University of Agriculture and Technology()
2nd Author's Name Hirotaka Maekawa
2nd Author's Affiliation Graduate School of Engineering, Tokyo University of Agriculture and Technology
3rd Author's Name Yoshihiro SANO
3rd Author's Affiliation Graduate School of Engineering, Tokyo University of Agriculture and Technology
4th Author's Name Yoichi TAKAHASHI
4th Author's Affiliation Graduate School of Engineering, Tokyo University of Agriculture and Technology
5th Author's Name Tadamasa KOBAYASHI
5th Author's Affiliation Graduate School of Engineering, Tokyo University of Agriculture and Technology
6th Author's Name Hiroaki HANABUSA
6th Author's Affiliation Graduate School of Engineering, Tokyo University of Agriculture and Technology
Date 2007-02-01
Paper # ED2006-243,SDM2006-231
Volume (vol) vol.106
Number (no) 520
Page pp.pp.-
#Pages 6
Date of Issue