Presentation 2007/2/2
Fault Diagnosis of Analog Circuit by Adaptive Test of Digital Circuit
Jiro KATO, Yukiya MIURA,
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Abstract(in English) In this paper, we propose a method for diagnosing analog circuits by adaptive test of digital circuits, which is based on the operation-region model and the X-Y zoning method. The X-Y zoning method uses the characteristics of circuit input voltage and output voltage. The operation-region model can be used to model circuit behaviors by utilizing changes in the operation regions of MOS transistors. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These improved methods can reduce a diagnostic sequence length without degrading the performance of diagnostic resolution.
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Keyword(in English) Analog circuit / Fault diagnosis / MOS transistors / Operation-region model / X-Y zoning method / Adaptive test
Paper # DC2006-90
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Conference Date 2007/2/2(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fault Diagnosis of Analog Circuit by Adaptive Test of Digital Circuit
Sub Title (in English)
Keyword(1) Analog circuit
Keyword(2) Fault diagnosis
Keyword(3) MOS transistors
Keyword(4) Operation-region model
Keyword(5) X-Y zoning method
Keyword(6) Adaptive test
1st Author's Name Jiro KATO
1st Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University()
2nd Author's Name Yukiya MIURA
2nd Author's Affiliation Graduate School of System Design, Tokyo Metropolitan University
Date 2007/2/2
Paper # DC2006-90
Volume (vol) vol.106
Number (no) 528
Page pp.pp.-
#Pages 6
Date of Issue