Presentation | 2007/2/2 Fault Diagnosis of Analog Circuit by Adaptive Test of Digital Circuit Jiro KATO, Yukiya MIURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, we propose a method for diagnosing analog circuits by adaptive test of digital circuits, which is based on the operation-region model and the X-Y zoning method. The X-Y zoning method uses the characteristics of circuit input voltage and output voltage. The operation-region model can be used to model circuit behaviors by utilizing changes in the operation regions of MOS transistors. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These improved methods can reduce a diagnostic sequence length without degrading the performance of diagnostic resolution. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Analog circuit / Fault diagnosis / MOS transistors / Operation-region model / X-Y zoning method / Adaptive test |
Paper # | DC2006-90 |
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Committee | DC |
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Conference Date | 2007/2/2(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fault Diagnosis of Analog Circuit by Adaptive Test of Digital Circuit |
Sub Title (in English) | |
Keyword(1) | Analog circuit |
Keyword(2) | Fault diagnosis |
Keyword(3) | MOS transistors |
Keyword(4) | Operation-region model |
Keyword(5) | X-Y zoning method |
Keyword(6) | Adaptive test |
1st Author's Name | Jiro KATO |
1st Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University() |
2nd Author's Name | Yukiya MIURA |
2nd Author's Affiliation | Graduate School of System Design, Tokyo Metropolitan University |
Date | 2007/2/2 |
Paper # | DC2006-90 |
Volume (vol) | vol.106 |
Number (no) | 528 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |