| Presentation | 2007/2/2 Analysis of Effective Decision Nodes on Test Generation Yusho OMORI, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, Kouji YAMAZAKI, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Many test generation algorithms decide decision nodes using backtrace. When a decision node in the region of search space where the solution does not exist is selected on the decision processing, backtracking frequently occurs. Therefore, the test generation algorithm using implying nodes which are effective in their reduction of the search space is proposed. In order to increase the efficiency of the test generation using implying nodes, it is considered effective to search for an implying node which implies many primary inputs. In this paper, the number of primary inputs which implying nodes inserted into a decision tree imply is analyzed and the influence which it has on test generation is evaluated. The three implying node search techniques were implemented and it analyzed by applying to an ISCAS85 benchmark circuit. It found that the number of primary inputs implied, the level of implying nodes, the number of conflicts for backtrace, and the number of selections for backtrace affect test generation from an analysis result |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test generation / implying nodes / decision nodes / backtrace / reduction of search space |
| Paper # | DC2006-86 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2007/2/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of Effective Decision Nodes on Test Generation |
| Sub Title (in English) | |
| Keyword(1) | test generation |
| Keyword(2) | implying nodes |
| Keyword(3) | decision nodes |
| Keyword(4) | backtrace |
| Keyword(5) | reduction of search space |
| 1st Author's Name | Yusho OMORI |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Fukuoka Laboratory for Emerging & Enabling Technology of SoC |
| 4th Author's Name | Kouji YAMAZAKI |
| 4th Author's Affiliation | School of Information and Communication, Meiji University |
| Date | 2007/2/2 |
| Paper # | DC2006-86 |
| Volume (vol) | vol.106 |
| Number (no) | 528 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |