| Presentation | 2007/2/2 On generation of high-quality test patterns for transition faults Shohei MORISHIMA, Masahiro YAMAMOTO, Seiji KAJIHARA, Xiaoqing WEN, Masayasu FUKUNAGA, Kazumi HATAYAMA, Takashi AIKYO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As a method to evaluate delay test quality, SDQM has been proposed. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method not only derives more accurate SDQL but also enhances the test quality of generated test patterns. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Delay test / Transition fault / SDQM / Test pattern generation / Small delay defect |
| Paper # | DC2006-84 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2007/2/2(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On generation of high-quality test patterns for transition faults |
| Sub Title (in English) | |
| Keyword(1) | Delay test |
| Keyword(2) | Transition fault |
| Keyword(3) | SDQM |
| Keyword(4) | Test pattern generation |
| Keyword(5) | Small delay defect |
| 1st Author's Name | Shohei MORISHIMA |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Masahiro YAMAMOTO |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | Seiji KAJIHARA |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Xiaoqing WEN |
| 4th Author's Affiliation | Kyushu Institute of Technology |
| 5th Author's Name | Masayasu FUKUNAGA |
| 5th Author's Affiliation | Semiconductor Technology Academic Research Center |
| 6th Author's Name | Kazumi HATAYAMA |
| 6th Author's Affiliation | Semiconductor Technology Academic Research Center |
| 7th Author's Name | Takashi AIKYO |
| 7th Author's Affiliation | Semiconductor Technology Academic Research Center |
| Date | 2007/2/2 |
| Paper # | DC2006-84 |
| Volume (vol) | vol.106 |
| Number (no) | 528 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |