Presentation | 2007/2/2 A Study on Test Generation for Fault Diagnosis Based on Justification Path Yasumitsu TAMOTO, Koji YAMAZAKI, Toshinori HOSOKAWA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | It is well known that the number of candidate faults depends on the quality of the test set using in fault diagnosis. Usually, a fault detection test set is used for fault diagnosis. Therefore, it is important to improve the diagnosability of a fault detection test set. In this paper, we focus on the justification of the fault propagation path, and show a simple idea to reduce the number of candidate faults which have no path from/to the faulty site. The effectiveness of our idea is demonstrated by computer simulation for iscas'85 benchmark circuits. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | fault diagnosis / logic faults / test generation / combination circuits / justification path |
Paper # | DC2006-83 |
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Committee | DC |
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Conference Date | 2007/2/2(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Study on Test Generation for Fault Diagnosis Based on Justification Path |
Sub Title (in English) | |
Keyword(1) | fault diagnosis |
Keyword(2) | logic faults |
Keyword(3) | test generation |
Keyword(4) | combination circuits |
Keyword(5) | justification path |
1st Author's Name | Yasumitsu TAMOTO |
1st Author's Affiliation | School of Science and Technology, Meiji University() |
2nd Author's Name | Koji YAMAZAKI |
2nd Author's Affiliation | School of Information and Communication, Meiji University |
3rd Author's Name | Toshinori HOSOKAWA |
3rd Author's Affiliation | College of Industrial Technology, Nihon University |
Date | 2007/2/2 |
Paper # | DC2006-83 |
Volume (vol) | vol.106 |
Number (no) | 528 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |