Presentation 2007/2/2
A Study on Test Generation for Fault Diagnosis Based on Justification Path
Yasumitsu TAMOTO, Koji YAMAZAKI, Toshinori HOSOKAWA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) It is well known that the number of candidate faults depends on the quality of the test set using in fault diagnosis. Usually, a fault detection test set is used for fault diagnosis. Therefore, it is important to improve the diagnosability of a fault detection test set. In this paper, we focus on the justification of the fault propagation path, and show a simple idea to reduce the number of candidate faults which have no path from/to the faulty site. The effectiveness of our idea is demonstrated by computer simulation for iscas'85 benchmark circuits.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) fault diagnosis / logic faults / test generation / combination circuits / justification path
Paper # DC2006-83
Date of Issue

Conference Information
Committee DC
Conference Date 2007/2/2(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Vice Chair

Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Study on Test Generation for Fault Diagnosis Based on Justification Path
Sub Title (in English)
Keyword(1) fault diagnosis
Keyword(2) logic faults
Keyword(3) test generation
Keyword(4) combination circuits
Keyword(5) justification path
1st Author's Name Yasumitsu TAMOTO
1st Author's Affiliation School of Science and Technology, Meiji University()
2nd Author's Name Koji YAMAZAKI
2nd Author's Affiliation School of Information and Communication, Meiji University
3rd Author's Name Toshinori HOSOKAWA
3rd Author's Affiliation College of Industrial Technology, Nihon University
Date 2007/2/2
Paper # DC2006-83
Volume (vol) vol.106
Number (no) 528
Page pp.pp.-
#Pages 5
Date of Issue