Presentation | 2007-01-26 High Time Resolution Carrier Interferometry for SDM/OFDM Chang-Jun Ahn, Satoshi Takahashi, Makoto Taromaru, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | When a MIMO system is introduced in a cellular system, we have to measure the received power from all the connectable base station (BS), as well as to identity all the CSI for the combination of transmitter and receiver antenna elements. One of the most typical channel estimation scheme is to employ a code division multiplexing (CDM) based scheme in which a unique spreading code is assigned to identify both BS and MS antenna elements. However, with increasing the number of transmit antenna elements, a large spreading code and pilot symbols are required to estimate an accurate CSI. To reduce this problem, the carrier interferometry (CI)-SDM/OFDM has been proposed. However, each detected channel impulse response is affected by the noise without noise whitening. Therefore, the pilot signal averaging process for multi-slot is necessary for improving the accuracy of CSI. As a result, the transmission rate is degraded due to a large number of pilot symbols transmission. To reduce these problems, hi this paper, we propose a high time resolution carrier interferometry (HTRCI) for SDM/OFDM to achieve an accurate CSI without increasing the number of pilot symbols. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | MIMO / SDM / OFDM / Carrier Interferometry (CI) |
Paper # | SIP2006-169,RCS2006-227 |
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Committee | RCS |
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Conference Date | 2007/1/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Radio Communication Systems (RCS) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | High Time Resolution Carrier Interferometry for SDM/OFDM |
Sub Title (in English) | |
Keyword(1) | MIMO |
Keyword(2) | SDM |
Keyword(3) | OFDM |
Keyword(4) | Carrier Interferometry (CI) |
1st Author's Name | Chang-Jun Ahn |
1st Author's Affiliation | ATR Wave Engineering laboratories() |
2nd Author's Name | Satoshi Takahashi |
2nd Author's Affiliation | Hiroshima City University |
3rd Author's Name | Makoto Taromaru |
3rd Author's Affiliation | ATR Wave Engineering laboratories |
Date | 2007-01-26 |
Paper # | SIP2006-169,RCS2006-227 |
Volume (vol) | vol.106 |
Number (no) | 480 |
Page | pp.pp.- |
#Pages | 4 |
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