Presentation 2007-01-17
Reduced Gain Variation against Temperature with NTC Thermistor on HPA Module for W-CDMA System
Akira KURIYAMA, Shigehiro YUYAMA, Masami OHNISHI, Hidetoshi MATSUMOTO, Tomonori TANOUE, Isao OHBU,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) A high-power amplifier (HPA) module for wide-band code division multiple access (W-CDMA) system with small gain variation against temperature is presented in this paper. Two temperature compensation techniques, which contain gain control bias circuits that correspond to temperature or negative temperature coefficient (NTC) thermistors were investigated. Comparison between the above techniques indicated that the technique with NTC thermistors was more effective in reducing gain variation without affecting linearity. A fabricated two-stage HPA module for W-CDMA system with a NTC thermistor in its input matching network provided a small gain variation within ±1dB and an adjacent channel leakage power ratio (ACLR) under -36dBc in the temperature range from -10 to +85℃ when ACLR was measured under load mismatched conditions, voltage standing wave ratio (VSWR) of 1.4:1.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) High-Power Amplifier Module / Thermistor / Gain Variation / Linearity / W-CDMA
Paper # ED2006-200,MW2006-153
Date of Issue

Conference Information
Committee ED
Conference Date 2007/1/10(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reduced Gain Variation against Temperature with NTC Thermistor on HPA Module for W-CDMA System
Sub Title (in English)
Keyword(1) High-Power Amplifier Module
Keyword(2) Thermistor
Keyword(3) Gain Variation
Keyword(4) Linearity
Keyword(5) W-CDMA
1st Author's Name Akira KURIYAMA
1st Author's Affiliation Central Research Laboratory, Hitachi Ltd.()
2nd Author's Name Shigehiro YUYAMA
2nd Author's Affiliation Renesas Technology Corp.
3rd Author's Name Masami OHNISHI
3rd Author's Affiliation Central Research Laboratory, Hitachi Ltd.
4th Author's Name Hidetoshi MATSUMOTO
4th Author's Affiliation Central Research Laboratory, Hitachi Ltd.
5th Author's Name Tomonori TANOUE
5th Author's Affiliation Renesas Technology Corp.
6th Author's Name Isao OHBU
6th Author's Affiliation Renesas Technology Corp.
Date 2007-01-17
Paper # ED2006-200,MW2006-153
Volume (vol) vol.106
Number (no) 459
Page pp.pp.-
#Pages 5
Date of Issue