Presentation | 2007-01-17 Reduced Gain Variation against Temperature with NTC Thermistor on HPA Module for W-CDMA System Akira KURIYAMA, Shigehiro YUYAMA, Masami OHNISHI, Hidetoshi MATSUMOTO, Tomonori TANOUE, Isao OHBU, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A high-power amplifier (HPA) module for wide-band code division multiple access (W-CDMA) system with small gain variation against temperature is presented in this paper. Two temperature compensation techniques, which contain gain control bias circuits that correspond to temperature or negative temperature coefficient (NTC) thermistors were investigated. Comparison between the above techniques indicated that the technique with NTC thermistors was more effective in reducing gain variation without affecting linearity. A fabricated two-stage HPA module for W-CDMA system with a NTC thermistor in its input matching network provided a small gain variation within ±1dB and an adjacent channel leakage power ratio (ACLR) under -36dBc in the temperature range from -10 to +85℃ when ACLR was measured under load mismatched conditions, voltage standing wave ratio (VSWR) of 1.4:1. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | High-Power Amplifier Module / Thermistor / Gain Variation / Linearity / W-CDMA |
Paper # | ED2006-200,MW2006-153 |
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Conference Information | |
Committee | ED |
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Conference Date | 2007/1/10(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Reduced Gain Variation against Temperature with NTC Thermistor on HPA Module for W-CDMA System |
Sub Title (in English) | |
Keyword(1) | High-Power Amplifier Module |
Keyword(2) | Thermistor |
Keyword(3) | Gain Variation |
Keyword(4) | Linearity |
Keyword(5) | W-CDMA |
1st Author's Name | Akira KURIYAMA |
1st Author's Affiliation | Central Research Laboratory, Hitachi Ltd.() |
2nd Author's Name | Shigehiro YUYAMA |
2nd Author's Affiliation | Renesas Technology Corp. |
3rd Author's Name | Masami OHNISHI |
3rd Author's Affiliation | Central Research Laboratory, Hitachi Ltd. |
4th Author's Name | Hidetoshi MATSUMOTO |
4th Author's Affiliation | Central Research Laboratory, Hitachi Ltd. |
5th Author's Name | Tomonori TANOUE |
5th Author's Affiliation | Renesas Technology Corp. |
6th Author's Name | Isao OHBU |
6th Author's Affiliation | Renesas Technology Corp. |
Date | 2007-01-17 |
Paper # | ED2006-200,MW2006-153 |
Volume (vol) | vol.106 |
Number (no) | 459 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |