Presentation 2007-01-19
Wideband Decoupling Properties by the Combination of Ultra-thin Insulator and EBG Structure
Seiju ICHJO, Takanobu KUSHIHIRA, Toshio SUDO,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Wide-band decoupling property of power/ground structure of a printed circuit board is required for the high-speed digital applications. Low S21 property with around -60 dB can be obtained by simply using thin dielectric layer of 16 um. While, the EBG (electromagnetic bandgap) structure with relatively thick dielectric layer of 500 um showed the typical stop-band property. By combining ultra-thin dielectric layer and EBG structure, low S21 property with wideband upto several GHz range has been obtained along with high isolation property of more than -80dB.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Wideband decoupling property / thin insulator / EBG structure / EMI / SSN
Paper # CPM2006-153,ICD2006-195
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Conference Information
Committee CPM
Conference Date 2007/1/11(1days)
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Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Wideband Decoupling Properties by the Combination of Ultra-thin Insulator and EBG Structure
Sub Title (in English)
Keyword(1) Wideband decoupling property
Keyword(2) thin insulator
Keyword(3) EBG structure
Keyword(4) EMI
Keyword(5) SSN
1st Author's Name Seiju ICHJO
1st Author's Affiliation Toshiba Corporation()
2nd Author's Name Takanobu KUSHIHIRA
2nd Author's Affiliation Manufacturing Solution Company Ltd (work in Toshiba Corporation)
3rd Author's Name Toshio SUDO
3rd Author's Affiliation Toshiba Corporation
Date 2007-01-19
Paper # CPM2006-153,ICD2006-195
Volume (vol) vol.106
Number (no) 467
Page pp.pp.-
#Pages 6
Date of Issue