| Presentation | 2007-01-19 Improvement of Layout Analysis by Connecting Emission or OBIRCH signals to CAD Information Akira SHIMASE, Akihito UCHIKADO, Mitsuaki SAEKI, Shinichi WATARAI, Takeshi SUZUKI, Toshiyuki MAJIMA, Kazuhiro HOTTA, Hirotoshi TERADA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Recent progress of LSI technology makes failure analysis more difficult. One of the difficulties is connecting sites of signal detected by emission microscope or OBRICH analysis tool to nets on layout data. "Failure Analysis Navigation System (=FA-Navigation System) is developed to make this routine work easier. The system sends sites of the signals to a layout viewer to extract nets passing through the signal areas and displays how many signals are contained in each net for assisting operator's judgment to pick up suspicious nets. This paper will present outline of the system, basic functions and new functions of the system. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Emission analysis / OBIRCH analysis / Layout analysis / CAD data / Net extraction / Assisting failure analysis |
| Paper # | CPM2006-146,ICD2006-188 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2007/1/11(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improvement of Layout Analysis by Connecting Emission or OBIRCH signals to CAD Information |
| Sub Title (in English) | |
| Keyword(1) | Emission analysis |
| Keyword(2) | OBIRCH analysis |
| Keyword(3) | Layout analysis |
| Keyword(4) | CAD data |
| Keyword(5) | Net extraction |
| Keyword(6) | Assisting failure analysis |
| 1st Author's Name | Akira SHIMASE |
| 1st Author's Affiliation | Renesas Technology Corp.() |
| 2nd Author's Name | Akihito UCHIKADO |
| 2nd Author's Affiliation | Renesas Technology Corp. |
| 3rd Author's Name | Mitsuaki SAEKI |
| 3rd Author's Affiliation | Renesas Technology Corp. |
| 4th Author's Name | Shinichi WATARAI |
| 4th Author's Affiliation | Renesas Technology Corp. |
| 5th Author's Name | Takeshi SUZUKI |
| 5th Author's Affiliation | Renesas Technology Corp. |
| 6th Author's Name | Toshiyuki MAJIMA |
| 6th Author's Affiliation | Renesas Technology Corp. |
| 7th Author's Name | Kazuhiro HOTTA |
| 7th Author's Affiliation | Hamamatsu Photonics K.K. |
| 8th Author's Name | Hirotoshi TERADA |
| 8th Author's Affiliation | Hamamatsu Photonics K.K. |
| Date | 2007-01-19 |
| Paper # | CPM2006-146,ICD2006-188 |
| Volume (vol) | vol.106 |
| Number (no) | 468 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |