Presentation 2006-12-13
Autocorrelation Test of Binary Sequence for Cryptographic Applications
Yuichi TAKEDA, Mituaki HUZII, Toshinari KAMAKURA, Norio WATANABE, Takakazu SUGIYAMA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Statistical methods proposed in NIST Special Publication 800-22 is used widely for testing randomness. In the Special Publication 800-22, 16 methods are proposed. Here we propose to use an autocorrelation test for testing randomness in cryptographic applications.
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Keyword(in English) Cryptograph / Testing randomness / SP-800-22 / Autocorrelation test
Paper # ISEC2006-101
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Committee ISEC
Conference Date 2006/12/6(1days)
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Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Autocorrelation Test of Binary Sequence for Cryptographic Applications
Sub Title (in English)
Keyword(1) Cryptograph
Keyword(2) Testing randomness
Keyword(3) SP-800-22
Keyword(4) Autocorrelation test
1st Author's Name Yuichi TAKEDA
1st Author's Affiliation 21st COE Progtam, Chuo University()
2nd Author's Name Mituaki HUZII
2nd Author's Affiliation Faculty of Science and Engineering, Chuo University
3rd Author's Name Toshinari KAMAKURA
3rd Author's Affiliation Faculty of Science and Engineering, Chuo University
4th Author's Name Norio WATANABE
4th Author's Affiliation Faculty of Science and Engineering, Chuo University
5th Author's Name Takakazu SUGIYAMA
5th Author's Affiliation Faculty of Science and Engineering, Chuo University
Date 2006-12-13
Paper # ISEC2006-101
Volume (vol) vol.106
Number (no) 411
Page pp.pp.-
#Pages 3
Date of Issue