Presentation | 2006-12-13 Autocorrelation Test of Binary Sequence for Cryptographic Applications Yuichi TAKEDA, Mituaki HUZII, Toshinari KAMAKURA, Norio WATANABE, Takakazu SUGIYAMA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Statistical methods proposed in NIST Special Publication 800-22 is used widely for testing randomness. In the Special Publication 800-22, 16 methods are proposed. Here we propose to use an autocorrelation test for testing randomness in cryptographic applications. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Cryptograph / Testing randomness / SP-800-22 / Autocorrelation test |
Paper # | ISEC2006-101 |
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Committee | ISEC |
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Conference Date | 2006/12/6(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Information Security (ISEC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Autocorrelation Test of Binary Sequence for Cryptographic Applications |
Sub Title (in English) | |
Keyword(1) | Cryptograph |
Keyword(2) | Testing randomness |
Keyword(3) | SP-800-22 |
Keyword(4) | Autocorrelation test |
1st Author's Name | Yuichi TAKEDA |
1st Author's Affiliation | 21st COE Progtam, Chuo University() |
2nd Author's Name | Mituaki HUZII |
2nd Author's Affiliation | Faculty of Science and Engineering, Chuo University |
3rd Author's Name | Toshinari KAMAKURA |
3rd Author's Affiliation | Faculty of Science and Engineering, Chuo University |
4th Author's Name | Norio WATANABE |
4th Author's Affiliation | Faculty of Science and Engineering, Chuo University |
5th Author's Name | Takakazu SUGIYAMA |
5th Author's Affiliation | Faculty of Science and Engineering, Chuo University |
Date | 2006-12-13 |
Paper # | ISEC2006-101 |
Volume (vol) | vol.106 |
Number (no) | 411 |
Page | pp.pp.- |
#Pages | 3 |
Date of Issue |