| Presentation | 2006-12-15 Examination of the breakdown gap-length due to micro gap discharge in voltage below 1000V Ken KAWAMATA, Shigeki MINEGISHI, Akira HAGA, Osamu Fujiwara, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The voltage and current transition duration due to small gap discharge as the low voltage ESD was investigated in time domain. The measurement system was set in 12GHz band width using the coaxial electrode system. The insertion loss of the experimental system was within -3dB in frequency range below 12GHz. As a consequence of experiments, voltage and current rise time of the transition duration were shown about 35 ps or less in voltage below 600V. It is reaching to limit of the band width using the measurement system. In this report, the gap length and the breakdown field strength were studied to confirm the rise time of the transition duration. The breakdown field strength was shown about 9×10^7[V/m] due to discharging voltage at 360V in positive polarity. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ESD / discharge / rise time / distributed constant system / gap length / breakdown field |
| Paper # | EMCJ2006-92 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2006/12/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Examination of the breakdown gap-length due to micro gap discharge in voltage below 1000V |
| Sub Title (in English) | |
| Keyword(1) | ESD |
| Keyword(2) | discharge |
| Keyword(3) | rise time |
| Keyword(4) | distributed constant system |
| Keyword(5) | gap length |
| Keyword(6) | breakdown field |
| 1st Author's Name | Ken KAWAMATA |
| 1st Author's Affiliation | Faculty of Engineering, Hachinohe Inst. of Tech.() |
| 2nd Author's Name | Shigeki MINEGISHI |
| 2nd Author's Affiliation | Faculty of Engineering, Tohoku Gakuin University |
| 3rd Author's Name | Akira HAGA |
| 3rd Author's Affiliation | Faculty of Engineering, Tohoku Gakuin University |
| 4th Author's Name | Osamu Fujiwara |
| 4th Author's Affiliation | Faculty of Engineering, Nagoya Inst. of Tech. |
| Date | 2006-12-15 |
| Paper # | EMCJ2006-92 |
| Volume (vol) | vol.106 |
| Number (no) | 433 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |