Presentation | 2006/12/1 Terahertz response of carbon nanotube quantum dots Tomoko FUSE, Yukio KAWANO, Yoshinobu AOYAGI, Koji ISHIBASHI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Single-electron transports have been measured at 1.5K on single-wall carbon nanotube (SWNT) quantum dots (QDs) under terahertz (THz)-wave irradiation with a frequency of 2.5THz. We have observed two kinds of Terahertz responses of SWNT QDs. One of the observations is new side-peaks that appeared only under the THz-wave irradiation. From the detailed analysis with energy scales associated with the QD, we conclude that the side-peaks originate from the photon-assisted tunneling (PAT) of an electron in the QD to the drain electrode. This is the first observation of the THz-PAT in QDs, which results from the larger energy scales of SWNT QDs, compared with those of standard semiconductor QDs. The other terahertz response of the SWNT QDs is a Coulomb peak shift under the THz-wave irradiation. After the irradiation had stopped, the Coulomb peak has returned to the original position. This event has a long time constants of seconds and a time trace of the signal deviates from a single exponential curve. These experimental results suggest that the THz irradiation causes charging process of trap states in the close vicinity of the SWNT QD, leading to the change in the effective gate voltage for the SWNT QD. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | carbon nanotubes / quantum dots / Terahertz / photon-assisted tunneling |
Paper # | ED2006-192 |
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Committee | ED |
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Conference Date | 2006/12/1(1days) |
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Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Terahertz response of carbon nanotube quantum dots |
Sub Title (in English) | |
Keyword(1) | carbon nanotubes |
Keyword(2) | quantum dots |
Keyword(3) | Terahertz |
Keyword(4) | photon-assisted tunneling |
1st Author's Name | Tomoko FUSE |
1st Author's Affiliation | Advanced Device Laboratory, The Physical and Chemical Research (RIKEN):Interdisciplinary Graduate School of Science & Engineering, Tokyo Institute of Technology() |
2nd Author's Name | Yukio KAWANO |
2nd Author's Affiliation | Advanced Device Laboratory, The Physical and Chemical Research (RIKEN):PRESTO, Japan Science and Technology (JST) |
3rd Author's Name | Yoshinobu AOYAGI |
3rd Author's Affiliation | Interdisciplinary Graduate School of Science & Engineering, Tokyo Institute of Technology |
4th Author's Name | Koji ISHIBASHI |
4th Author's Affiliation | Advanced Device Laboratory, The Physical and Chemical Research (RIKEN):CREST, Japan Science and Technology (JST) |
Date | 2006/12/1 |
Paper # | ED2006-192 |
Volume (vol) | vol.106 |
Number (no) | 403 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |