Presentation | 2006/12/1 Research and Development of Millimeter-Wave GaN Transistors Masataka HIGASHIWAKI, Takashi MIMURA, Toshiaki MATSUI, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | GaN heterostructure field-effect transistors (HFETs) are promising not only as high-power and high-breakdown-voltage devices but also as high-frequency ones, because the saturation electron velocity in GaN is relatively high. By using three characteristic techniques to improve high-frequency characteristics of GaN HFETs, which are (1) high-Al-composition and extremely thin barrier layers, (2) Cat-CVD SiN passivation, and (3) T-shaped short gates defined by electron-beam lithography, we have succeeded in suppressing short-channel effects in short-gate HFETs with a gate length of less than 0.1μm. Here, we report on device characteristics of short-gate AlGaN/GaN and InAlN/GaN HFETs, which are being developed for applications in the frequency range above 50GHz. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | AlGaN/GaN / InAlN/GaN / heterostructure field-effect transistors (HFETs) / catalytic chemical vapor deposition (Cat-CVD) / millimeter-wave |
Paper # | ED2006-184 |
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Conference Information | |
Committee | ED |
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Conference Date | 2006/12/1(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Electron Devices (ED) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Research and Development of Millimeter-Wave GaN Transistors |
Sub Title (in English) | |
Keyword(1) | AlGaN/GaN |
Keyword(2) | InAlN/GaN |
Keyword(3) | heterostructure field-effect transistors (HFETs) |
Keyword(4) | catalytic chemical vapor deposition (Cat-CVD) |
Keyword(5) | millimeter-wave |
1st Author's Name | Masataka HIGASHIWAKI |
1st Author's Affiliation | National Institute of Information and Communications Technology (NICT)() |
2nd Author's Name | Takashi MIMURA |
2nd Author's Affiliation | National Institute of Information and Communications Technology (NICT):Fujitsu Laboratories Ltd. |
3rd Author's Name | Toshiaki MATSUI |
3rd Author's Affiliation | National Institute of Information and Communications Technology (NICT) |
Date | 2006/12/1 |
Paper # | ED2006-184 |
Volume (vol) | vol.106 |
Number (no) | 403 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |