Presentation | 2006-11-10 Influence of interfacial built-in potential on the open circuit voltage of CuPc/Fullerene double layered photovoltaic device Hirokazu Nakamichi, Eiji ITOH, Keiichi MIYAIRI, |
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Abstract(in English) | We investigated the surface potential built across the CuPc/C_<60> interface and electrode/semiconductor interface as a function of the film thickness of organic semiconductor layers by conventional Kelvin prove technique. CuPc donates electrons to ITO electrode, whereas C_<60> accepts electrons from Al and ITO electrodes. The electron accepting material C_<60> accepts electrons from the electron donating material CuPc at CuPc/C_<60> interface, and this tendency is enhanced by photoillumination. The thicknesses of charged interfacial layer, presented here, are 10-20nm. It was also found from I-V characteristics that the direction of internal electric field at CuPc/C_<60> interface was opposite to the direction of the photocurrent. We therefore concluded that the energetic difference between HOMO of CuPc and LUMO of C_<60> is more important for the origin of open circuit voltage (V_ |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Surface potential / Open circuit voltage / Photovoltaic device / Phthalocyanine / Fullerene |
Paper # | OME2006-98 |
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Committee | OME |
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Conference Date | 2006/11/3(1days) |
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Registration To | Organic Material Electronics (OME) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Influence of interfacial built-in potential on the open circuit voltage of CuPc/Fullerene double layered photovoltaic device |
Sub Title (in English) | |
Keyword(1) | Surface potential |
Keyword(2) | Open circuit voltage |
Keyword(3) | Photovoltaic device |
Keyword(4) | Phthalocyanine |
Keyword(5) | Fullerene |
1st Author's Name | Hirokazu Nakamichi |
1st Author's Affiliation | Faculty of Engineering, Shinshu University() |
2nd Author's Name | Eiji ITOH |
2nd Author's Affiliation | Faculty of Engineering, Shinshu University |
3rd Author's Name | Keiichi MIYAIRI |
3rd Author's Affiliation | Faculty of Engineering, Shinshu University |
Date | 2006-11-10 |
Paper # | OME2006-98 |
Volume (vol) | vol.106 |
Number (no) | 339 |
Page | pp.pp.- |
#Pages | 6 |
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