Presentation 2006-11-10
Effect of Surface Roughness of Substrate on Structure and Temperature Coefficient of Resistance (TCR) of NiCr Films Deposited by Sputtering
Satoshi IWATSUBO, Takaaki SHIMIZU,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) NiCr films on Al_2O_3 substrates with various rough surfaces were deposited by RF magnetron sputtering (RFMS) and ion-beam sputtering (IBS) as a parameter of film thickness t_F. The t_F dependence of the structure and the temperature coefficient of resistance (TCR) of the films was investigated. The values of thermal strain λ_T owing to roughness of the films were estimated by FEM simulation. It was found that the roughness of the substrates caused the changes in the film structure, λ_T and the film thickness, so that the value of TCR of the NiCr films was decreased on a large scale.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Temperature Coefficient of Resistance (TCR) / NiCr / thin film / sputtering / electrical properties / surface roughness
Paper # CPM2006-128
Date of Issue

Conference Information
Committee CPM
Conference Date 2006/11/2(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Effect of Surface Roughness of Substrate on Structure and Temperature Coefficient of Resistance (TCR) of NiCr Films Deposited by Sputtering
Sub Title (in English)
Keyword(1) Temperature Coefficient of Resistance (TCR)
Keyword(2) NiCr
Keyword(3) thin film
Keyword(4) sputtering
Keyword(5) electrical properties
Keyword(6) surface roughness
1st Author's Name Satoshi IWATSUBO
1st Author's Affiliation Toyama Industrial Technology Center()
2nd Author's Name Takaaki SHIMIZU
2nd Author's Affiliation Toyama Industrial Technology Center
Date 2006-11-10
Paper # CPM2006-128
Volume (vol) vol.106
Number (no) 336
Page pp.pp.-
#Pages 6
Date of Issue