Presentation 2006-11-09
Preparation of HfN_x thin films by hot-wire method and their barrier properties interposed between Cu interconnects and SiO_2 or SiOC layers
Masaru SATO, Mayumi B. TAKEYAMA, Atsushi NOYA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) An extremely thin diffusion barrier of low resistivity is required for down-scaled interconnects on low-k insulating materials to reduce the RC signal delay. The requisite of low-temperature preparation is also another issue for preparation of barriers. We propose a new preparation method, in which a sputter-deposited metal film is nitrided by radical species activated by a hot-wire made of W. We applied this method to prepare the extremely thin HfN_x film on SiO_2 or SiOC layer as a barrier against Cu diffusion. The HfN_x barrier of 3~5nm in thickness tolerated annealing at temperatures higher than 500℃ with excellent barrier properties comparable to those of a reactively-sputtered HfN_x film.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) interconnect / low resistivity / SiOC / Cu / HfN barrier
Paper # CPM2006-121
Date of Issue

Conference Information
Committee CPM
Conference Date 2006/11/2(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Component Parts and Materials (CPM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Preparation of HfN_x thin films by hot-wire method and their barrier properties interposed between Cu interconnects and SiO_2 or SiOC layers
Sub Title (in English)
Keyword(1) interconnect
Keyword(2) low resistivity
Keyword(3) SiOC
Keyword(4) Cu
Keyword(5) HfN barrier
1st Author's Name Masaru SATO
1st Author's Affiliation Department of Electrical and Electronic Engineering Kitami Institute of Technology()
2nd Author's Name Mayumi B. TAKEYAMA
2nd Author's Affiliation Department of Electrical and Electronic Engineering Kitami Institute of Technology
3rd Author's Name Atsushi NOYA
3rd Author's Affiliation Department of Electrical and Electronic Engineering Kitami Institute of Technology
Date 2006-11-09
Paper # CPM2006-121
Volume (vol) vol.106
Number (no) 336
Page pp.pp.-
#Pages 6
Date of Issue