Presentation 2006-11-28
Test Scheduling for SoGs with Built-In Self-Repairable Memory Cores
Yusuke FUKUDA, Tomokazu YONEDA, Hideo FUJIWARA,
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Abstract(in English) This paper presents a power-constrained test scheduling mehtod for SoCs with built-in self repairable memories which are tested the following three stages: 1) test, 2) diagnosis/repair and 3) re-test. The proposed method can acheive efficient and effective scheduling by considering that it is not necessary to test the three stages of each core consecutively as long as they are tested in correct order. Moreover, by using the concept of abort-on-fail which means that the test is aborted as soon as a fault is detected, we can reduce expected test time.
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Keyword(in English) System-on-Chip / Built-In Self-Repair / Power Constraints / Test Scheduling
Paper # VLD2006-61,DC2006-48
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Committee DC
Conference Date 2006/11/21(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Test Scheduling for SoGs with Built-In Self-Repairable Memory Cores
Sub Title (in English)
Keyword(1) System-on-Chip
Keyword(2) Built-In Self-Repair
Keyword(3) Power Constraints
Keyword(4) Test Scheduling
1st Author's Name Yusuke FUKUDA
1st Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology()
2nd Author's Name Tomokazu YONEDA
2nd Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology
3rd Author's Name Hideo FUJIWARA
3rd Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology
Date 2006-11-28
Paper # VLD2006-61,DC2006-48
Volume (vol) vol.106
Number (no) 390
Page pp.pp.-
#Pages 6
Date of Issue