Presentation 2006-10-04
High voltage-capacitance characteristics measurement for SiC-JFET : Circuits for applying high bias voltage and gate voltage to SiC-JFET
Syuntaro MATSUZAKI, Tsuyoshi FUNAKI, Takashi HIKIHARA,
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Abstract(in English) We have been modeling SiC power devices for circuit simulation to design and evaluate power converter circuit. The electrical characteristics measurement of SiC-SBD and its modeling were discussed in the previous article. This article reports the measuring methods for the characterization of SiC-JFET. The DC characteristics of a device can be measured by using existing measuring equipments. However there is no existing devices to measure the AC characteristics of SiC-JFET input capacitance, output capacitance, and feedback capacitance over high bias drain voltage with applying negative DC gate voltage to keep the JFET off condition. The authors propose measurement circuits for the AC characterization of a JFET. The authors also discuss the models of SiC-JFET with the measured AC and DC characteristics.
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Keyword(in English) SiC-JFET / Capacitance characteristics / Injected gate charge / Parameter extraction
Paper # CAS2006-24,NLP2006-47
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Committee NLP
Conference Date 2006/9/27(1days)
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Registration To Nonlinear Problems (NLP)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) High voltage-capacitance characteristics measurement for SiC-JFET : Circuits for applying high bias voltage and gate voltage to SiC-JFET
Sub Title (in English)
Keyword(1) SiC-JFET
Keyword(2) Capacitance characteristics
Keyword(3) Injected gate charge
Keyword(4) Parameter extraction
1st Author's Name Syuntaro MATSUZAKI
1st Author's Affiliation Department of Electrical Engineering, Kyoto University()
2nd Author's Name Tsuyoshi FUNAKI
2nd Author's Affiliation Department of Electrical Engineering, Kyoto University
3rd Author's Name Takashi HIKIHARA
3rd Author's Affiliation Department of Electrical Engineering, Kyoto University
Date 2006-10-04
Paper # CAS2006-24,NLP2006-47
Volume (vol) vol.106
Number (no) 274
Page pp.pp.-
#Pages 6
Date of Issue