| Presentation | 2006-10-26 Discussion for Effective Use of Integrated Thin Film Type RF Noise Suppressors Kaori MARUTA, Syo MUROGA, Yutaka SHIMADA, Masahiro YAMAGUCHI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper discusses about frequency and size dependence on the optimum sheet resistance of RF noise suppression films, which maximize high harmonic losses in transmission lines, using three-dimensional (3-D) finite-element method (FEM) electromagnetic field simulation. In the simulation model, noise suppression films with sheet resistance of 10^0～10^6Ω/square were put on top of a microstrip-line. Based on simulated results of eddy currents in the film, mechanism of optimum sheet resistance was analyzed. At 0.5, 2,5 and 10GHz, simulated maximum power losses of the microstrip-line were 0.06 with sheet resistance of 2000Ω/square, 0.19 with sheet resistance of 1000Ω/square, 0.34 with sheet resistance of 400Ω/square and 0.49 with sheet resistance of 200Ω/square. With increasing of the film length, the optimum sheet resistance is fixed and power losses increase proportional to the length. With increasing of the film width, the optimum sheet resistance shift to lower value and power losses increase. With increasing of the film thickness, both the optimum sheet resistance and power losses are almost same for all thicknesses. Designing a magnetic film based on optimum sheet resistance and ferromagnetic resonance, the simulated power loss reached 0.53, which was increased by 63% compared with nonmagnetic film. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EMC / RF noise suppressor / sheet resistance / eddy current loss / ferromagnetic resonance losses |
| Paper # | EMCJ2006-55,MW2006-111 |
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| Conference Information | |
| Committee | EMCJ |
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| Conference Date | 2006/10/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromagnetic Compatibility (EMCJ) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Discussion for Effective Use of Integrated Thin Film Type RF Noise Suppressors |
| Sub Title (in English) | |
| Keyword(1) | EMC |
| Keyword(2) | RF noise suppressor |
| Keyword(3) | sheet resistance |
| Keyword(4) | eddy current loss |
| Keyword(5) | ferromagnetic resonance losses |
| 1st Author's Name | Kaori MARUTA |
| 1st Author's Affiliation | School of Engineering, Tohoku University() |
| 2nd Author's Name | Syo MUROGA |
| 2nd Author's Affiliation | School of Engineering, Tohoku University |
| 3rd Author's Name | Yutaka SHIMADA |
| 3rd Author's Affiliation | School of Engineering, Tohoku University |
| 4th Author's Name | Masahiro YAMAGUCHI |
| 4th Author's Affiliation | School of Engineering, Tohoku University |
| Date | 2006-10-26 |
| Paper # | EMCJ2006-55,MW2006-111 |
| Volume (vol) | vol.106 |
| Number (no) | 322 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |