Presentation 2006-10-26
Moments Analysis of EM Noise caused by Power/Ground Noise of Electric Unit
Yasuhiro SHIRAKI, Yasuhiro YAMANAKA, Norio ABE,
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Abstract(in English) In this paper, EM radiation (EMI) due to power and ground fluctuation of electric unit at FM band were investigated using 3-D method of moments (MoM) considering a power current model of LSI. To improve analytical accuracy of MoM, the model representing the LSI as a linear equivalent circuit was modified. The Electric field intensity at far field was evaluated about two kinds of printed circuit boards by MoM and experiment, and the difference of results between MoM and experiments was less than 5dB.
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Keyword(in English) electric units / printed circuit boards / method of moments / EM radiation / power/ground noise
Paper # EMCJ2006-53,MW2006-109
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Committee EMCJ
Conference Date 2006/10/19(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Moments Analysis of EM Noise caused by Power/Ground Noise of Electric Unit
Sub Title (in English)
Keyword(1) electric units
Keyword(2) printed circuit boards
Keyword(3) method of moments
Keyword(4) EM radiation
Keyword(5) power/ground noise
1st Author's Name Yasuhiro SHIRAKI
1st Author's Affiliation ADVANCED TECHNOLOGY R&D CENTER, Mitsubishi Electric Corporation()
2nd Author's Name Yasuhiro YAMANAKA
2nd Author's Affiliation Industrial Design Center, Mitsubishi Electric Corporation
3rd Author's Name Norio ABE
3rd Author's Affiliation Kyoto Office, Mitsubishi Electric Engineering Company
Date 2006-10-26
Paper # EMCJ2006-53,MW2006-109
Volume (vol) vol.106
Number (no) 322
Page pp.pp.-
#Pages 6
Date of Issue