Presentation | 2006/10/19 Current Trend of the International Standard for Functional Safety : System Modeling for Estimation of Safety-Integrity Level (SIL) Yoshinobu SATO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The safety integrity level (SIL) is determined by taking account of both random hardware failures of SRS and demands for implementation of a safety function(s) to prevent a hazardous event(s) from occurring. Here, one of the simplest systems, in which an SRS with a constant failure rate implements a safety function and no other protection layer than that SRS exists, is taken for showing how the relationship between the failures of SRS and the risk frequency (i.e. hazardous event rate) is formulated by use of Markov techniques. The conventional method for evaluation of PFD and PFH sometimes gives us dangerous estimation of the tolerable common-caused dangerous-undetected failure-rate. The approach in the present paper will contribute toward solving the problem. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Functional Safety / SIL / Safety-Related System / Hazardous Event Rate |
Paper # | SSS2006-14 |
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Committee | SSS |
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Conference Date | 2006/10/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Safety (SSS) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Current Trend of the International Standard for Functional Safety : System Modeling for Estimation of Safety-Integrity Level (SIL) |
Sub Title (in English) | |
Keyword(1) | Functional Safety |
Keyword(2) | SIL |
Keyword(3) | Safety-Related System |
Keyword(4) | Hazardous Event Rate |
1st Author's Name | Yoshinobu SATO |
1st Author's Affiliation | Faculty of Engineering, Tokyo University of Marine Science & Technology() |
Date | 2006/10/19 |
Paper # | SSS2006-14 |
Volume (vol) | vol.106 |
Number (no) | 311 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |