Presentation 2006-08-17
Critical temperature switch circuit with CMOS subthreshold region
Atsushi HAGIWARA, Tetsuya HIROSE, Tetsuya ASAI, Yoshihito AMEMIYA,
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Abstract(in English) We propose a thermosensing circuit that changes its internal state abruptly at a threshold temperature. The circuit switches its output-node voltage from a high value to a low one when temperature exceeds the threshold. The circuit makes use of the transition of a MOSFET resistor from strong-inversion operation to week-inversion or subthreshold operation. The threshold temperature for the transition can be set to a desired value from 0℃ to 100℃ by adjusting the parameters of MOSFETs in the circuit. The circuit can be made with a standard CMOS process and can be used as over-temperature detectors and over-current protectors for LSI circuits.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) CMOS / subthreshold current / temperature detection
Paper # SDM2006-131,ICD2006-85
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Committee SDM
Conference Date 2006/8/10(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Critical temperature switch circuit with CMOS subthreshold region
Sub Title (in English)
Keyword(1) CMOS
Keyword(2) subthreshold current
Keyword(3) temperature detection
1st Author's Name Atsushi HAGIWARA
1st Author's Affiliation Department of Electrical Engineering, Hokkaido University()
2nd Author's Name Tetsuya HIROSE
2nd Author's Affiliation Department of Electrical Engineering, Hokkaido University
3rd Author's Name Tetsuya ASAI
3rd Author's Affiliation Department of Electrical Engineering, Hokkaido University
4th Author's Name Yoshihito AMEMIYA
4th Author's Affiliation Department of Electrical Engineering, Hokkaido University
Date 2006-08-17
Paper # SDM2006-131,ICD2006-85
Volume (vol) vol.106
Number (no) 206
Page pp.pp.-
#Pages 5
Date of Issue