| Presentation | 2006-09-26 Self-consistent full-band Monte Carlo device simulation for strained nMOSFETs incorporating vertical quantization, multi-subband, and different channel orientation effects Masami HANE, Takeo IKEZAWA, MIichihito KAWADA, Tatsuya EZAKI, Toyoji YAMAMOTO, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Simulation analysis of channel-orientation effects on strained silicon MOSFETs based on a full-band Monte Carlo method considering sub-band structures in the channel region was presented. Simulation results show that the nMOSFET drain-current increases with applying uniaxial tensile stress while it exhibits different behavior for <100> and <110> different channel directions. Further detailed analyses have been made to clarify appropriate physical mechanism of the drive-current-increase by means of a source-side-injection/backscattering concept. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Strained Silicon / Full-band Monte Carlo / subband / channel orientation |
| Paper # | VLD2006-50,SDM2006-171 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2006/9/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Self-consistent full-band Monte Carlo device simulation for strained nMOSFETs incorporating vertical quantization, multi-subband, and different channel orientation effects |
| Sub Title (in English) | |
| Keyword(1) | Strained Silicon |
| Keyword(2) | Full-band Monte Carlo |
| Keyword(3) | subband |
| Keyword(4) | channel orientation |
| 1st Author's Name | Masami HANE |
| 1st Author's Affiliation | System Devices Research Laboratories, NEC Corporation() |
| 2nd Author's Name | Takeo IKEZAWA |
| 2nd Author's Affiliation | NEC Informatec Systems, Inc. |
| 3rd Author's Name | MIichihito KAWADA |
| 3rd Author's Affiliation | NEC Informatec Systems, Inc. |
| 4th Author's Name | Tatsuya EZAKI |
| 4th Author's Affiliation | Hiroshima University |
| 5th Author's Name | Toyoji YAMAMOTO |
| 5th Author's Affiliation | MIRAI-ASET |
| Date | 2006-09-26 |
| Paper # | VLD2006-50,SDM2006-171 |
| Volume (vol) | vol.106 |
| Number (no) | 255 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |