| Presentation | 2006-09-26 Global Identification of Variability Factors and Its Application to the Statistical Worst-Case Model Generation Katsumi EIKYU, Takeshi OKAGAKI, Motoaki TANIZAWA, Kiyoshi ISHIKAWA, Osamu TSUCHIYA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A novel methodology is presented to generate the worst-case model including extraction of its compact model parameters. This method enables physically accurate worst-case prediction in the early stage of device development concurrently. It is found through intensive TEG analysis and TCAD simulation that correlations between process factors have a significant impact on the worst-case corner estimation. A new extraction method of compact model parameters based on error propagation analysis is developed to consider correlations between parameters. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Variability / Worst-Case Model / TEG / RSM / Statistical Parameter Extraction |
| Paper # | VLD2006-41,SDM2006-162 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2006/9/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Global Identification of Variability Factors and Its Application to the Statistical Worst-Case Model Generation |
| Sub Title (in English) | |
| Keyword(1) | Variability |
| Keyword(2) | Worst-Case Model |
| Keyword(3) | TEG |
| Keyword(4) | RSM |
| Keyword(5) | Statistical Parameter Extraction |
| 1st Author's Name | Katsumi EIKYU |
| 1st Author's Affiliation | Renesas Technology Corp.() |
| 2nd Author's Name | Takeshi OKAGAKI |
| 2nd Author's Affiliation | Renesas Technology Corp. |
| 3rd Author's Name | Motoaki TANIZAWA |
| 3rd Author's Affiliation | Renesas Technology Corp. |
| 4th Author's Name | Kiyoshi ISHIKAWA |
| 4th Author's Affiliation | Renesas Technology Corp. |
| 5th Author's Name | Osamu TSUCHIYA |
| 5th Author's Affiliation | Renesas Technology Corp. |
| Date | 2006-09-26 |
| Paper # | VLD2006-41,SDM2006-162 |
| Volume (vol) | vol.106 |
| Number (no) | 255 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |