| Presentation | 2006/7/25 Evaluation of Terrestrial-Neutron Induced Single Event of Memory Devices : An Outlook for Logic Devices Yasuo YAHAGI, Eishi IBE, Hironaru YAMAGUCHI, Hideaki KAMEYAMA, Yasuyuki SAITO, Takashi AKIOKA, Shigehisa YAMAMOTO, Mitsumori HIDAKA, Atsushi SAITO, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Scaling of semiconductor devices down to sub-100nm technologies has raised a problem that the impact of neutron-induced errors especially on combinational logic circuits is becoming more critical. Concerning memory devices, the international standardization of test procedure for soft errors has been achieved though new neutron-induced error modes are being reported. On the other hand, various challenges on characterizing the susceptibility of combinational logic circuits to terrestrial neutron have been attempted and a standard soft-error evaluation method of logic circuits has not been achieved yet due to its complication. In this paper, test methods of terrestrial-neutron soft-errors of memory devices including field test, accelerated test by using high energy particle accelerators, and simulations are explained, and a brief description of the soft-error evaluation of combinational logic circuits is given. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | cosmic rays / neutron / soft-error / single event / SEU / SET / SEL / memory / combinational logic |
| Paper # | DC2006-13 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2006/7/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Terrestrial-Neutron Induced Single Event of Memory Devices : An Outlook for Logic Devices |
| Sub Title (in English) | |
| Keyword(1) | cosmic rays |
| Keyword(2) | neutron |
| Keyword(3) | soft-error |
| Keyword(4) | single event |
| Keyword(5) | SEU |
| Keyword(6) | SET |
| Keyword(7) | SEL |
| Keyword(8) | memory |
| Keyword(9) | combinational logic |
| 1st Author's Name | Yasuo YAHAGI |
| 1st Author's Affiliation | Production Engineering Research Laboratory, Hitachi, Ltd.() |
| 2nd Author's Name | Eishi IBE |
| 2nd Author's Affiliation | Production Engineering Research Laboratory, Hitachi, Ltd. |
| 3rd Author's Name | Hironaru YAMAGUCHI |
| 3rd Author's Affiliation | Production Engineering Research Laboratory, Hitachi, Ltd. |
| 4th Author's Name | Hideaki KAMEYAMA |
| 4th Author's Affiliation | Renesas Technology Corp. |
| 5th Author's Name | Yasuyuki SAITO |
| 5th Author's Affiliation | Renesas Technology Corp. |
| 6th Author's Name | Takashi AKIOKA |
| 6th Author's Affiliation | Renesas Technology Corp. |
| 7th Author's Name | Shigehisa YAMAMOTO |
| 7th Author's Affiliation | Renesas Technology Corp. |
| 8th Author's Name | Mitsumori HIDAKA |
| 8th Author's Affiliation | Elpida Memory Inc. |
| 9th Author's Name | Atsushi SAITO |
| 9th Author's Affiliation | Elpida Memory Inc. |
| Date | 2006/7/25 |
| Paper # | DC2006-13 |
| Volume (vol) | vol.106 |
| Number (no) | 198 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |